Probing electron transport and structural properties of nanostructures on Si with a quadraprobe scanning tunneling microscope
- ORNL
The electron transport and structural properties of nanostructured materials have been examined with a newly developed low temperature quadraprobe scanning tunneling microscope (STM) system. The quadraprobe STM system, as a "nano" version of a four-probe station provides an integrated research platform with a low temperature four-probe STM, a molecular-beam epitaxy growth chamber, a high resolution scanning electron microscope, and a scanning Auger microscope. The four STM probes can be driven independently with sub-nanometer precision, enabling conventional STM imaging and four-point electrical transport study of surface electronic systems and nanostructured materials at temperatures down to 10 K. Self-assembled nanostructures grown on Si by doping with metal atoms (Au, Gd, Ag) have been fabricated and characterized in situ.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- DE-AC05-00OR22725
- OSTI ID:
- 944602
- Resource Relation:
- Conference: Advanced Matallization Conference 2007, Albany, NY, USA, 20071008, 20071008
- Country of Publication:
- United States
- Language:
- English
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