Variable-temperature independently driven four-tip scanning tunneling microscope

Journal Article · Tue May 15 04:00:00 EDT 2007 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2735593· OSTI ID:20953446

Hobara, Rei; Nagamura, Naoka; Hasegawa, Shuji; Matsuda, Iwao; Yamamoto, Yuko; Miyatake, Yutaka; Nagamura, Toshihiko ^[1]

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1. Department of Physics, School of Science, University of Tokyo, 7-3-1 Hongo, bunkyo-ku, Tokyo 113-0033 (Japan)

The authors have developed an ultrahigh vacuum (UHV) variable-temperature four-tip scanning tunneling microscope (STM), operating from room temperature down to 7 K, combined with a scanning electron microscope (SEM). Four STM tips are mechanically and electrically independent and capable of positioning in arbitrary configurations in nanometer precision. An integrated controller system for both of the multitip STM and SEM with a single computer has also been developed, which enables the four tips to operate either for STM imaging independently and for four-point probe (4PP) conductivity measurements cooperatively. Atomic-resolution STM images of graphite were obtained simultaneously by the four tips. Conductivity measurements by 4PP method were also performed at various temperatures with the four tips in square arrangement with direct contact to the sample surface.

• OSTI ID: 20953446
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 5 Vol. 78; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ACCURACY
COMPUTERS
CONFIGURATION
ELECTRIC CONDUCTIVITY
GRAPHITE
IMAGES
POSITIONING
PROBES
RESOLUTION
SCANNING ELECTRON MICROSCOPY
SCANNING TUNNELING MICROSCOPY
SURFACES
TEMPERATURE RANGE 0000-0013 K
TEMPERATURE RANGE 0013-0065 K
TEMPERATURE RANGE 0065-0273 K
TEMPERATURE RANGE 0273-0400 K