Confocal operation of a transmission electron microscope with two aberration correctors
- Trinity College Dublin, School of Physics, Dublin 2 (Ireland)
The authors demonstrate that confocal imaging trajectories can be established in a transmission electron microscope fitted with two spherical aberration correctors. An atomic-scale electron beam, focused by aberration-corrected illumination optics, is directly imaged by a second aberration-corrected system. The initial experiment described indicates how aberration-corrected scanning confocal electron microscopy will allow three-dimensional imaging and analysis of materials with atomic lateral resolution and with a depth resolution of a few nanometers. The depth resolution in the confocal mode is shown to be robust to the uncorrected chromatic aberration of the lenses, unlike depth sectioning using a single lens.
- OSTI ID:
- 20861131
- Journal Information:
- Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 12 Vol. 89; ISSN APPLAB; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
Similar Records
Nanoscale Energy-Filtered Scanning Confocal Electron Microscopy Using a Double-Aberration-Corrected Transmission Electron Microscope
Tuning fifth-order aberrations in a Quadrupole-Octupole Corrector
Depth Sectioning with the Aberration-Corrected Scanning Transmission Electron Microscope
Journal Article
·
Fri May 21 00:00:00 EDT 2010
· Physical Review Letters
·
OSTI ID:21410680
Tuning fifth-order aberrations in a Quadrupole-Octupole Corrector
Journal Article
·
Sat Dec 31 23:00:00 EST 2011
· Microscopy and Microanalysis
·
OSTI ID:1055030
Depth Sectioning with the Aberration-Corrected Scanning Transmission Electron Microscope
Journal Article
·
Sat Dec 31 23:00:00 EST 2005
· Proceedings of the National Academy of Sciences
·
OSTI ID:1003507