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Title: Direct evidence of N aggregation and diffusion in Au{sup +} irradiated GaN

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.2219418· OSTI ID:20860546
; ; ; ;  [1]
  1. Pacific Northwest National Laboratory, Richland, Washington 99352 (United States)

A surface amorphized layer and a buried disordered structure were created in gallium nitride (GaN) irradiated using 1.0 MeV Au{sup +} ions to fluences of 25 and 70 Au{sup +}/nm{sup 2} at room temperature. Bubbles of N{sub 2} gas within both the amorphized and disordered GaN are formed. A gradient profile with a lower N concentration in the amorphized region is observed, which provides direct evidence of N loss by diffusion in the Au{sup +} irradiated GaN. These results are important to understanding the amorphization processes in GaN and may have significant implications for the design and fabrication of GaN-based devices.

OSTI ID:
20860546
Journal Information:
Applied Physics Letters, Vol. 89, Issue 2; Other Information: DOI: 10.1063/1.2219418; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English

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