Microfield distributions in strongly coupled two-component plasmas

Journal Article · Thu Sep 01 04:00:00 EDT 2005 · Physical Review. E, Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

DOI:https://doi.org/10.1103/PhysRevE.72.036403· OSTI ID:20706355

Nersisyan, H B; Toepffer, C; Zwicknagel, G ^[1]

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1. Institut fuer Theoretische Physik II, Erlangen-Nuernberg Universitaet, Staudtstrasse 7, D-91058 Erlangen (Germany)

The electric microfield distribution at charged particles is studied for two-component electron-ion plasmas using molecular dynamics simulation and theoretical models. The particles are treated within classical statistical mechanics using an electron-ion Coulomb potential regularized at distances less than the de Broglie length to take into account the quantum-diffraction effects. The potential-of-mean-force (PMF) approximation is deduced from a canonical ensemble formulation. The resulting probability density of the electric microfield satisfies exactly the second-moment sum rule without the use of adjustable parameters. The correlation functions between the charged radiator and the plasma ions and electrons are calculated using molecular dynamics simulations and the hypernetted-chain approximation for a two-component plasma. It is shown that the agreement between the theoretical models for the microfield distributions and the simulations is quite good in general.

• OSTI ID: 20706355
• Journal Information: Physical Review. E, Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics, Journal Name: Physical Review. E, Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics Journal Issue: 3 Vol. 72; ISSN PLEEE8; ISSN 1063-651X
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
COLLISIONAL PLASMA
CORRELATION FUNCTIONS
COULOMB FIELD
DIFFRACTION
DISTRIBUTION
ELECTRONS
IONS
MOLECULAR DYNAMICS METHOD
PLASMA DENSITY
PLASMA SIMULATION
STATISTICAL MECHANICS
SUM RULES