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Electric microfield distributions in strongly coupled plasmas

Journal Article · · Phys. Rev. A; (United States)
A new method is developed for calculating electric microfield distributions in a plasma. The method uses a coupling-parameter integration technique to express the Fourier transform of the microfield distribution in terms of a special pair-distribution function. An approximation of this function yielding the exact second moment of the microfield distribution gives results which agree well with computer simulations for strongly coupled one-component plasmas.
Research Organization:
Department of Mathematics, Rutgers University, New Brunswick, New Jersey 08903
OSTI ID:
5464483
Journal Information:
Phys. Rev. A; (United States), Journal Name: Phys. Rev. A; (United States) Vol. 28:3; ISSN PLRAA
Country of Publication:
United States
Language:
English

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