Why cryogenically cooled, thin crystals handle extremely high power densities
Conference
·
OSTI ID:206984
Recently, a new type of cryogenically cooled high heat load monochromator was proposed and, developed at Argonne National Laboratory and tested at European Synchrotron Radiation Facility (ESRF.) These tests showed that powers of 153 W and power densities of 450 W/mm{sup 2} cause only negligible strain. These powers and power densities are larger than will be absorbed by the first crystal on an undulator beamline at the Advanced Photon Source (APS). In our earlier work we suggested that the crystal might show strain at much lower values of the powers and power densities. We now can explain the ESRF results in terms of the unique role the negative thermal expansion coefficient of Si plays in minimizing strain.
- Research Organization:
- Argonne National Lab., IL (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 206984
- Report Number(s):
- ANL/MSD/CP--87985; CONF-9510119--28; ON: DE96007244
- Country of Publication:
- United States
- Language:
- English
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