Experimental results with cryogenically cooled, thin, silicon crystal x-ray monochromator on high-heat-flux beamlines
- Argonne National Lab., IL (United States). Advanced Photon Source
A novel, silicon crystal monochromator has been designed and tested for use on undulator and focused wiggler beamlines at third-generation synchrotron sources. The crystal utilizes a thin, partially transmitting diffracting element fabricated within a liquid-nitrogen cooled, monolithic block of silicon. This report summarizes the results from performance tests conducted at the European Synchrotron Radiation Facility (ESRF) using a focused wiggler beam and at the Advanced Photon Source (APS) on an undulator beamline. These experiments indicate that a cryogenic crystal can handle the very high power and power density x-ray beams of modern synchrotrons with sub-arcsec thermal broadening of the rocking curve. The peak power density absorbed on the surface of the crystal at the ESRF exceeded 90 W/mm{sup 2} with an absorbed power of 116 W, this takes into account the spreading of the beam due to the Bragg angle of 11.4{degree}. At the APS, the peak heat flux incident on the crystal was 1.5 W/mA/mm{sup 2} with a power of 6.1 W/mA for a 2.0 H x 2.5 V mm{sup 2} beam at an undulator gap of 11.1 mm and stored current up to 96 mA.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 524782
- Report Number(s):
- CONF-960848--; ISBN 0-8194-2243-6
- Country of Publication:
- United States
- Language:
- English
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