Soft X-ray Scanning Transmission Microscope Working in an Extended Energy Range at the Advanced Light Source
Journal Article
·
· AIP Conference Proceedings
- Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)
- Dept. of Geological and Environmental Sciences, Stanford University, Stanford, CA 94305 (United States)
- Materials Sciences Dept., Stanford University, Stanford, CA 94305 (United States)
- Applied Physics Dept., Stanford University, Stanford, CA 94305 (United States)
- Stanford Synchrotron Radiation Laboratory, SLAC, Menlo Park, CA 94025 (United States)
One of the ALS scanning transmission x-ray microscopes (STXMs) has been moved to the new ALS molecular environmental science beamline 11.0.2. The STXM is located on the microscopy branchline downstream of an elliptically-polarizing undulator delivering x-rays from 80 eV to 1900 eV. The wide energy range allows STXM operations with the current zone plate from 190 eV to about 1900 eV, the highest accessible energy with sufficient flux.
- OSTI ID:
- 20652880
- Journal Information:
- AIP Conference Proceedings, Vol. 705, Issue 1; Conference: 8. international conference on synchrotron radiation instrumentation, San Francisco, CA (United States), 25-29 Aug 2003; Other Information: DOI: 10.1063/1.1758053; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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