Soft X-ray Scanning Transmission Microscope Working in an Extended Energy Range at the Advanced Light Source

Journal Article · Wed May 12 04:00:00 EDT 2004 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.1758053· OSTI ID:20652880

Tyliszczak, T; Warwick, T; Kilcoyne, A L.D.; Fakra, S; Shuh, D K ^[1]; Yoon, T H ^[2]; Brown, Jr, G E ^[2]; Andrews, S ^[3]; Chembrolu, V; Strachan, J ^[4]; Acremann, Y ^[5]

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1. Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)
2. Dept. of Geological and Environmental Sciences, Stanford University, Stanford, CA 94305 (United States)
3. Materials Sciences Dept., Stanford University, Stanford, CA 94305 (United States)
4. Applied Physics Dept., Stanford University, Stanford, CA 94305 (United States)
5. Stanford Synchrotron Radiation Laboratory, SLAC, Menlo Park, CA 94025 (United States)

One of the ALS scanning transmission x-ray microscopes (STXMs) has been moved to the new ALS molecular environmental science beamline 11.0.2. The STXM is located on the microscopy branchline downstream of an elliptically-polarizing undulator delivering x-rays from 80 eV to 1900 eV. The wide energy range allows STXM operations with the current zone plate from 190 eV to about 1900 eV, the highest accessible energy with sufficient flux.

• OSTI ID: 20652880
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 705; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ABSORPTION
ADVANCED LIGHT SOURCE
EQUIPMENT
EV RANGE 10-100
EV RANGE 100-1000
KEV RANGE 01-10
MEASURING METHODS
MICROSCOPES
MICROSCOPY
SOFT X RADIATION
X-RAY SPECTRA