A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source

Journal Article · Sat Aug 01 04:00:00 EDT 1998 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1149041· OSTI ID:639207

Warwick, T; Franck, K; Kortright, J B; Meigs, G; Moronne, M; Myneni, S; Rotenberg, E; Seal, S; Steele, W F ^[1]; Ade, H; Garcia, A ^[2]; Cerasari, S ^[3]; Denlinger, J ^[4]; Hayakawa, S ^[5]; Hitchcock, A P; Tyliszczak, T ^[6]; Kikuma, J ^[7]; Rightor, E G ^[8]; Shin, H ^[9]; Tonner, B P ^[10]

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1. Lawrence Berkeley National Laboratory, University of California, Berkeley, California 94720 (United States)
2. Department of Physics, North Carolina State University, Raleigh, North Carolina 27695 (United States)
3. Universita di Trieste, 134127 Trieste (Italy)
4. University of Michigan, Ann Arbor, Michigan 48109 (United States)
5. School of Engineering, University of Tokyo, Tokyo 113 (Japan)
6. Department of Chemistry, McMaster University, Hamilton, Ontario L8S 4M1 (Canada)
7. ASAHI Chemical Industry Co., Fuji shi 416 (Japan)
8. DOW Chemical, Midland, Michigan 48641 (United States)
9. Pohang Accelerator Laboratory, POSTECH, Pohang 790784 (Korea)
10. Department of Physics, University of Wisconsin, Milwaukee, Wisconsin 53211 (United States)

Design and performance of a scanning transmission x-ray microscope (STXM) at the Advanced Light Source is described. This instrument makes use of a high brightness undulator beamline and extends the STXM technique to new areas of research. After 2.5 years of development it is now an operational tool for research in polymer science, environmental chemistry, and magnetic materials. {copyright} {ital 1998 American Institute of Physics.}

• OSTI ID: 639207
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 8 Vol. 69; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
BRIGHTNESS
CHEMISTRY
DESIGN
MICROSCOPY
POLYMERS
SYNCHROTRON RADIATION
X-RAY EQUIPMENT
X-RAY SPECTRA
X-RAY SPECTROSCOPY