Coherent Soft X-ray Branchline at the Advanced Light Source

Journal Article · Wed May 12 00:00:00 EDT 2004 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.1757830· OSTI ID:20652977

Rosfjord, Kristine; Attwood, David ^[1]; Kemp, Charles; Denham, Paul; Gullikson, Eric; Batson, Phillip; Rekawa, Senajith ^[1]

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1. Center for X-Ray Optics, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)

A new coherent soft X-ray branchline at the advanced light source has begun operation. Using the third harmonic from an 8 cm period undulator, this branch delivers coherent soft x-rays ranging from 200eV to 1000eV. Here the beamline layout and Airy patterns generated by single pinhole diffraction at 500 eV and 600 eV are presented.

• OSTI ID: 20652977
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 705; ISSN 0094-243X; ISSN APCPCS
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
ADVANCED LIGHT SOURCE
BEAM OPTICS
ELECTRON BEAMS
EV RANGE 100-1000
MONOCHROMATORS
OPERATION
SOFT X RADIATION
SYNCHROTRON RADIATION
X-RAY DIFFRACTION