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On the origin of the two-dimensional electron gas at the AlGaN/GaN heterostructure interface

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.1850600· OSTI ID:20636967
;  [1]
  1. Department of Electrical Engineering, University of South Carolina, Columbia, South Carolina 29208 (United States)

Bare surface barrier heights (BSBHs) of AlGaN/GaN heterostructures, with varying AlGaN layer thickness and {approx}35% Al alloy composition, have been measured using UV laser induced transients. The BSBH has been observed to vary with AlGaN thickness, before it saturates beyond a critical thickness, and the variation found to be very similar to that of the two-dimensional electron gas (2DEG) density at the interface. Such a trend can be explained by considering the presence of surface donor states distributed in the band gap. The density of the surface donor states has been calculated from the variation of the surface barrier with the 2DEG density, and found to be almost constant at {approx}1.6x10{sup 13} cm{sup -2} eV{sup -1} in the energy range of {approx}1.0-1.8 eV from the conduction band. After SiN{sub x} passivation of the surface, the BSBH reduces, and sheet charge density increases, indicating the presence of positive charges in the passivation layer.

OSTI ID:
20636967
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 4 Vol. 86; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
English

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