Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Superconductivity-induced effect on c-axis electronic Raman scattering in Bi{sub 2}Sr{sub 2}CaCu{sub 2}O{sub 8+{delta}} single crystals

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.59626· OSTI ID:20216667
 [1];  [1];  [1];  [2];  [2]
  1. Department of Physics and Science and Technology Center for Superconductivity, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801-3080 (United States)
  2. Materials Science Division and Science and Technology Center for Superconductivity, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
We report on the c-axis-polarized electronic Raman scattering of Bi{sub 2}Sr{sub 2}CaCu{sub 2}O{sub 8+{delta}} single crystals with various oxygen concentrations. Below T{sub c}, there is a low-energy redistribution of the electronic continuum and the presence of a 2{delta} peak-like feature for all doping levels studied. The superconductivity-induced effect is also accumulated from frequencies as high as 40{delta}. (c) 1999 American Institute of Physics.
OSTI ID:
20216667
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 483; ISSN APCPCS; ISSN 0094-243X
Country of Publication:
United States
Language:
English

Similar Records

c -Axis Electronic Raman Scattering in Bi{sub 2} Sr{sub 2} CaCu{sub 2} O{sub 8+{delta} }
Journal Article · Wed Mar 31 23:00:00 EST 1999 · Physical Review Letters · OSTI ID:341195

Raman scattering spectra of superconducting Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8/ single crystals
Journal Article · Wed Nov 30 23:00:00 EST 1988 · Phys. Rev. B: Condens. Matter; (United States) · OSTI ID:6889664

An optical investigation of electronic excitations in the high-temperature superconductors YBa/sub 2/Cu/sub 3/O/sub 7-. delta. / and Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+. Delta. /
Journal Article · Tue Oct 31 23:00:00 EST 1989 · IEEE (Institute of Electrical and Electronics Engineers) Journal of Quantum Electronics; (USA) · OSTI ID:5283488