Stability of Si-Interstitial Defects: From Point to Extended Defects
Journal Article
·
· Physical Review Letters
- Department of Physics, Ohio State University, Columbus, Ohio 43210 (United States)
- Department of Electrical Engineering, Ohio State University, Columbus, Ohio 43210 (United States)
Trends in the growth of extended interstitial defects are extracted from extensive tight-binding and ab inito local density approximation simulations. With an increasing number of interstitials, the stable defect shape evolves from compact to chainlike to rodlike. The rodlike {l_brace}311{r_brace} defect, formed from (011) interstitial chains, is stabilized as it grows, elongating in the chain direction. Accurate parametrization of the defect-formation energy on the number of interstitials and interstitial chains, together with the anisotropy of the interstitial capture radius, enables macroscopic defect-growth simulations. (c) 2000 The American Physical Society.
- OSTI ID:
- 20215243
- Journal Information:
- Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 3 Vol. 84; ISSN 0031-9007; ISSN PRLTAO
- Country of Publication:
- United States
- Language:
- English
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