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Title: Micromechanical potentiometric sensors

Patent ·
OSTI ID:20013926

A microcantilever potentiometric sensor utilized for detecting and measuring physical and chemical parameters in a sample of media is described. The microcantilevered spring element includes at least one chemical coating on a coated region, that accumulates a surface charge in response to hydrogen ions, redox potential, or ion concentrations in a sample of the media being monitored. The accumulation of surface charge on one surface of the microcantilever, with a differing surface charge on an opposing surface, creates a mechanical stress and a deflection of the spring element. One of a multitude of deflection detection methods may include the use of a laser light source focused on the microcantilever, with a photo-sensitive detector receiving reflected laser impulses. The microcantilevered spring element is approximately 1 to 100 {mu}m long, approximately 1 to 50 {mu}m wide, and approximately 0.3 to 3.0 {mu}m thick. An accuracy of detection of deflections of the cantilever is provided in the range of 0.01 nanometers of deflection. The microcantilever apparatus and a method of detection of parameters require only microliters of a sample to be placed on, or near the spring element surface. The method is extremely sensitive to the detection of the parameters to be measured.

Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-96OR22464; AC05-84OR21400
OSTI ID:
20013926
Resource Relation:
Other Information: PBD: 25 Jan 2000
Country of Publication:
United States
Language:
English

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