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Secondary electron and light emission from Ag and NaCl targets bombarded by Ar ions

Conference ·
OSTI ID:199782
 [1]
  1. Texas A&M Univ., College Station, TX (United States)

Secondary electron and light emission yields following the bombardment of Ag and NaCl targets with Ar ions have been studied. Secondary electron spectra and light yields have been obtained as a function of incident ion beam kinetic energy and charge state. Specific Auger transitions in the electron yield from both target and surface elements were found to increase as the incident ion charge state increases. At a bombarding kinetic energy of 48 keV the light yield from the NaCl target increases as the incident ion charge state increases as opposed to no change for the Ag target. Light yields as a function of the ion beam kinetic energy were measured from 8 keV to 99 keV. Sputtering calculations have been carried out for both NaCl and Ag targets to investigate possible mechanisms for explaining the observed kinetic energy dependence of the light yield in these two systems.

OSTI ID:
199782
Report Number(s):
CONF-941129--
Country of Publication:
United States
Language:
English

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