Secondary ion emission induced by multicharged 18-keV ion bombardment of solid targets

Journal Article · Mon Mar 07 04:00:00 EST 1988 · Phys. Rev. Lett.; (United States)

DOI:https://doi.org/10.1103/PhysRevLett.60.948· OSTI ID:5420458

Della-Negra, S; Depauw, J; Joret, H; Le Beyec, Y; Schweikert, E A

Solid targets of SiO/sub 2/ CsI, and organic layers of phenylalanine have been bombarded by multicharged Ar/sup q//sup +/ ions with 1less than or equal toqless than or equal to11. The secondary ion yield has been measured as a function of the incident charge state. No charge-state dependence was observed for most of the atomic and molecular ions, which were identified by time-of-flight mass spectrometry. In contrast, the H/sup +/-ion emission is strongly dependent on the incident charge state.

• Research Organization: Institut de Physique Nucleaire, F-91406 Orsay, France
• OSTI ID: 5420458
• Journal Information: Phys. Rev. Lett.; (United States), Journal Name: Phys. Rev. Lett.; (United States) Vol. 60:10; ISSN PRLTA
• Country of Publication: United States
• Language: English

Related Subjects

656003* -- Condensed Matter Physics-- Interactions between Beams & Condensed Matter-- (1987-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALKALI METAL COMPOUNDS
AMINO ACIDS
ARGON IONS
CARBOXYLIC ACIDS
CATIONS
CESIUM COMPOUNDS
CESIUM IODIDES
CESIUM IONS
CHALCOGENIDES
CHARGE STATE
CHARGED PARTICLES
COLLISIONS
EMISSION
ENERGY RANGE
HALIDES
HALOGEN COMPOUNDS
HYDROGEN IONS
HYDROGEN IONS 1 PLUS
INORGANIC PHOSPHORS
IODIDES
IODINE COMPOUNDS
ION COLLISIONS
ION EMISSION
IONS
KEV RANGE
KEV RANGE 10-100
LAYERS
MASS SPECTROSCOPY
MINERALS
MOLECULAR IONS
ORGANIC ACIDS
ORGANIC COMPOUNDS
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
PHENYLALANINE
PHOSPHORS
SCATTERING
SECONDARY EMISSION
SILICA
SILICON COMPOUNDS
SILICON OXIDES
SPECTROSCOPY
TIME-OF-FLIGHT METHOD
YIELDS