Microbeam PIXE analysis using wavelength dispersive spectrometry
Conference
·
OSTI ID:199723
- Sandia National Lab., Livermore, CA (United States)
Wavelength dispersive x-ray (WDX) detectors offer significant capabilities not available with energy dispersive detectors normally used in PIXE analysis. The authors have installed a commercial WDX detector on their new microbeam system located at Lawrence Livemore National Laboratory. The exceptional energy resolution of the WDX detector results not only in better elemental resolution, but better sensitivity due to improved signal to background ratios. Faster counting of a single trace element is possible in some situations since signals from the major elements are rejected. In addition, it is possible to analyze low Z elements including oxygen, carbon and beryllium. Advantages and limitations of wavelength dispersive spectrometry and special considerations for calibration and operation are discussed. Results are presented for light element analysis, trace element analysis, and scanning PIXE analysis.
- OSTI ID:
- 199723
- Report Number(s):
- CONF-941129--
- Country of Publication:
- United States
- Language:
- English
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