Analysis of HgI{sub 2} and PbI{sub 2} crystals and detectors by particle-induced x-ray emission (PIXE) and ion backscattering spectroscopy (IBS)

Conference · Mon Mar 01 04:00:00 EST 1993

OSTI ID:10172187

Bench, G S; Heikkinen, D W ^[1]; Antolak, A J; Morse, D H; Pontau, A E; James, R B; David, D C ^[2]; Burger, A ^[3]; Van Den Berg, L ^[4]

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1. Lawrence Livermore National Lab., CA (United States)
2. Sandia National Labs., Livermore, CA (United States)
3. Fisk Univ., Nashville, TN (United States)
4. EG and G Energy Measurements, Inc., Goleta, CA (United States)

The Ion Micro-Analysis Group (IMAG) in Livermore conducts quantitative trace elemental analysis with PIXE and depth profiling with IBS using an MeV ion microbeam. The system has the capability to produce two-dimensional trace element and IBS images. PIXE analyses have been conducted on HgI{sub 2} and PbI{sub 2} crystals and detector materials in order to identify and quantify near surface trace contaminants. IBS measurements have been conducted to investigate elemental depth distributions in various materials. The results of measurements on several different samples are reported and a discussion of factors affecting quantitative in vacuo microanalysis of these materials is presented.

• Research Organization: Lawrence Livermore National Lab., CA (United States); Sandia National Labs., Albuquerque, NM (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: W-7405-ENG-48; AC04-76DP00789
• OSTI ID: 10172187
• Report Number(s): UCRL-JC--113607; CONF-930405--30; ON: DE93017168
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
420500
665100
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BACKSCATTERING
CRYSTALS
ION SCATTERING ANALYSIS
LEAD IODIDES
MATERIALS TESTING
MERCURY IODIDES
NUCLEAR TECHNIQUES IN CONDENSED MATTER PHYSICS
PIXE ANALYSIS