An annular Si drift detector mu PIXE system using AXSIA analysis.

Journal Article · Thu Jul 01 04:00:00 EDT 2004 · Proposed for publication in X-Ray Spectrometry.

OSTI ID:964530

Doyle, Barney Lee; Rossi, Paolo ^[1]; Walsh, David Simpson; Rohde, M ^[2]; Schulein, T ^[2]; Kotula, Paul Gabriel

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1. University of Padua and INFN, Italy
2. RONTEC GMBH, Berlin, Germany

Sandia and Rontec have developed an annular, 12-element, 60 mm{sup 2}, Peltier-cooled, translatable, silicon drift detector called the SDD-12. The body of the SDD-12 is only 22.8 mm in total thickness and easily fits between the sample and the upstream wall of the Sandia microbeam chamber. At a working distance of 1 mm, the solid angle is 1.09 sr. The energy resolution is 170 eV at count rates <40 kcps and 200 eV for rates of 1 Mcps. X-ray count rates must be maintained below 50 kcps when protons are allowed to strike the full area of the SDD. Another innovation with this new {mu}PIXE system is that the data are analyzed using Sandia's Automated eXpert Spectral Image Analysis (AXSIA).

• Research Organization: Sandia National Laboratories
• Sponsoring Organization: USDOE
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 964530
• Report Number(s): SAND2004-3652J
• Journal Information: Proposed for publication in X-Ray Spectrometry., Journal Name: Proposed for publication in X-Ray Spectrometry.
• Country of Publication: United States
• Language: English

Related Subjects

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS
ENERGY RESOLUTION
PROTONS
SILICON
THICKNESS