Depth-resolved Laue microdiffraction with coded apertures

Gürsoy, Doğa; Sheyfer, Dina; Wojcik, Michael; Liu, Wenjun; Tischler, Jonathan Z.

doi:10.1107/s1600576722007099

Depth-resolved Laue microdiffraction with coded apertures

Journal Article · Tue Aug 30 00:00:00 EDT 2022 · Journal of Applied Crystallography (Online)

DOI:https://doi.org/10.1107/s1600576722007099· OSTI ID:1909016

Gürsoy, Doğa ^[1]; Sheyfer, Dina ^[1]; ^[1]; ^[1]; Tischler, Jonathan Z. ^[1]

Argonne National Laboratory (ANL), Lemont, IL (United States)

A rapid data acquisition and reconstruction method is introduced to image the crystalline structure of materials and the associated strain and orientations at micrometre resolution using Laue diffraction. The method relies on scanning a coded aperture across the diffracted X-ray beam from broadband illumination and a reconstruction algorithm to resolve Laue microdiffraction patterns as a function of depth along the incident illumination path. It provides rapid access to full diffraction information for sub-micrometre volume elements in bulk materials. Both the theory and the experimental validation of this imaging approach are presented in this report.

View Accepted Manuscript (DOE)

Research Organization:: Argonne National Laboratory (ANL), Lemont, IL (United States)

Sponsoring Organization:: USDOE Laboratory Directed Research and Development (LDRD) Program; USDOE Office of Science (SC)

Grant/Contract Number:: AC02-06CH11357

OSTI ID:: 1909016

Journal Information:: Journal of Applied Crystallography (Online), Journal Name: Journal of Applied Crystallography (Online) Journal Issue: 5 Vol. 55; ISSN 1600-5767

Publisher:: International Union of CrystallographyCopyright Statement

Country of Publication:: United States

Language:: English

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36 MATERIALS SCIENCE
Laue microscopy
X-ray diffraction
coded sensing

Depth-resolved Laue microdiffraction with coded apertures

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