Residual strain orientation in rolled titanium determined with synchrotron X-ray Laue microdiffraction

Devoe, Michelle; Tamura, Nobumichi; Wenk, Hans-Rudolf

doi:10.1107/s1600576722011311

Residual strain orientation in rolled titanium determined with synchrotron X-ray Laue microdiffraction

Journal Article · Wed Feb 01 00:00:00 EST 2023 · Journal of Applied Crystallography (Online)

DOI:https://doi.org/10.1107/s1600576722011311· OSTI ID:1972947

Devoe, Michelle ^[1]; ^[2]; Wenk, Hans-Rudolf ^[1]

Univ. of California, Berkeley, CA (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)

Previously, synchrotron X-ray Laue microdiffraction has been used to measure the magnitudes of residual strain in materials. Recently the method was advanced to determine the orientation of the strain ellipsoid and applied to naturally deformed quartzites; however, the deformation history of these quartzites is ambiguous due to their natural origin. Here, in this study, synchrotron X-ray Laue microdiffraction (µXRD) is used to measure the residual strain for the first time in a sample with known stress history, rolled titanium. A deviatoric strain tensor is calculated from each Laue diffraction image collected with two µXRD scans of a rolled titanium sheet in different sample orientations. The principal strain axes are calculated using an eigen decomposition of the deviatoric strain tensors. The results show that the principal axis of compression is aligned with the normal direction of the titanium sheet, and the principal axis of extension is aligned with the rolling direction. Pole figures are used to represent the 3D distribution of residual strain axes.

View Accepted Manuscript (DOE)

Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-05CH11231; FG02-05ER15637; SC0014664

OSTI ID:: 1972947

Journal Information:: Journal of Applied Crystallography (Online), Journal Name: Journal of Applied Crystallography (Online) Journal Issue: 1 Vol. 56; ISSN 1600-5767

Publisher:: International Union of CrystallographyCopyright Statement

Country of Publication:: United States

Language:: English

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