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Title: Formation of tubular conduction channel in a SiGe(P)/Si core/shell nanowire heterostructure

Journal Article · · APL Materials
DOI:https://doi.org/10.1063/5.0119654· OSTI ID:1898359

Realizing a tubular conduction channel within a one-dimensional core–shell nanowire (NW) enables better understanding of quantum phenomena and exploration of electronic device applications. Herein, we report the growth of a SiGe(P)/Si core/shell NW heterostructure using a chemical vapor deposition coupled with vapor–liquid–solid growth mechanism. The entire NW heterostructure behaves as a p-type semiconductor, which demonstrates that the high-density carriers are confined within the 4 nm-thick Si shell and form a tubular conduction channel. These findings are confirmed by both calculations and the gate-dependent current–voltage ( I d – V g ) characteristics. Atomic resolution microscopic analyses suggest a coherent epitaxial core/shell interface where strain is released by forming dislocations along the axial direction of the NW heterostructure. Additional surface passivation achieved via growing a SiGe(P)/Si/SiGe core/multishell NW heterostructure suggests potential strategies to enhance the tubular carrier density, which could be further modified by improving multishell crystallinity and structural design.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
Sponsoring Organization:
USDOE Laboratory Directed Research and Development (LDRD) Program; USDOE National Nuclear Security Administration (NNSA); Ministry of Science and Technology; National Taiwan University
Grant/Contract Number:
89233218CNA000001; 20200672DI; NA0003525; 110-2622-8-002-014
OSTI ID:
1898359
Alternate ID(s):
OSTI ID: 1897335
Report Number(s):
LA-UR-22-21355; TRN: US2311066
Journal Information:
APL Materials, Vol. 10, Issue 11; ISSN 2166-532X
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

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