Vector Electrometry in a Wide-Gap-Semiconductor Device Using a Spin-Ensemble Quantum Sensor

Yang, Bang; Murooka, Takuya; Mizuno, Kosuke; Kim, Kwangsoo; Kato, Hiromitsu; Makino, Toshiharu; Ogura, Masahiko; Yamasaki, Satoshi; Schmidt, Marek E.; Mizuta, Hiroshi; Yacoby, Amir; Hatano, Mutsuko; Iwasaki, Takayuki

doi:10.1103/physrevapplied.14.044049

Vector Electrometry in a Wide-Gap-Semiconductor Device Using a Spin-Ensemble Quantum Sensor

Journal Article · Tue Oct 27 00:00:00 EDT 2020 · Physical Review Applied

DOI:https://doi.org/10.1103/physrevapplied.14.044049· OSTI ID:1853034

^[1]; ^[2]; Mizuno, Kosuke ^[2]; Kim, Kwangsoo ^[2]; Kato, Hiromitsu ^[3]; Makino, Toshiharu ^[3]; Ogura, Masahiko ^[3]; Yamasaki, Satoshi ^[3]; Schmidt, Marek E. ^[4]; Mizuta, Hiroshi ^[4]; ^[5]; Hatano, Mutsuko ^[2]; ^[2]

Tokyo Institute of Technology (Japan); OSTI
Tokyo Institute of Technology (Japan)
National Inst. of Advanced Industrial Science and Technology (AIST), Tsukuba (Japan)
National Inst. of Advanced Industrial Science and Technology (AIST), Ishikawa (Japan)
Harvard Univ., Cambridge, MA (United States); Tokyo Institute of Technology (Japan)

Nitrogen-vacancy (N-V) centers in diamond work as a quantum electrometer. Using an ensemble state of N-V centers, we propose vector electrometry and demonstrate measurements in a diamond electronic device. A transverse electric field applied to the N-V axis under a high voltage is measured, while applying a transverse magnetic field. The response of the energy-level shift against the electric field is significantly enhanced compared with that against an axial magnetic field. Repeating the measurement of the transverse electric field for multiple N-V axes, our team obtains the components of the electric field generated in the device.

View Accepted Manuscript (DOE)

Research Organization:: Harvard University, Cambridge, MA (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: SC0019300

OSTI ID:: 1853034

Journal Information:: Physical Review Applied, Journal Name: Physical Review Applied Journal Issue: 4 Vol. 14; ISSN 2331-7019

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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