Vapor-Cell-Based Atomic Electrometry for Detection Frequencies below 1 kHz

Jau, Yuan-Yu; Carter, Tony

doi:10.1103/physrevapplied.13.054034

Vapor-Cell-Based Atomic Electrometry for Detection Frequencies below 1 kHz

Journal Article · Thu May 14 00:00:00 EDT 2020 · Physical Review Applied

DOI:https://doi.org/10.1103/physrevapplied.13.054034· OSTI ID:1644058

Jau, Yuan-Yu ^[1]; Carter, Tony ^[1]

Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

Rydberg-assisted atomic electrometry using alkali-metal atoms contained inside a vacuum environment for detecting external electric fields at frequencies below a few kilohertz has been quite challenging due to the low-frequency electric-field-screening effect that is caused by the alkali-metal atoms adsorbed on the inner surface of the container. In this work, we report a very slow electric-field-screening phenomenon with a timescale up to the order of seconds on a rubidium-vapor cell that is made of monocrystalline sapphire. Furthermore, using this sapphire rubidium-vapor cell with an optically induced, internal bias electric field, we demonstrate vapor-cell-based, low-frequency atomic electrometry that responds to the electric field strength linearly. Limited by the given experimental conditions, this demonstrated atomic electrometer uses an active volume of 11 mm³ and delivers a spectral noise floor of around 0.34 mV/m √Hz and a 3-dB low cutoff frequency of around 770 Hz inside the vapor cell. This work investigates a regime of vapor-cell-basedatomic electrometry that was seldom studied before, which may enable more applications that use atomicelectric-field-sensing technology.

View Accepted Manuscript (DOE)

Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: AC04-94AL85000; NA0003525

OSTI ID:: 1644058

Report Number(s):: SAND--2020-1553J; 683659

Journal Information:: Physical Review Applied, Journal Name: Physical Review Applied Journal Issue: 5 Vol. 13; ISSN 2331-7019

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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