Nanoscale electric field imaging with an ambient scanning quantum sensor microscope

Qiu, Ziwei; Hamo, Assaf; Vool, Uri; Zhou, Tony X.; Yacoby, Amir

doi:10.1038/s41534-022-00622-3

Nanoscale electric field imaging with an ambient scanning quantum sensor microscope

Journal Article · Fri Sep 09 00:00:00 EDT 2022 · npj Quantum Information

DOI:https://doi.org/10.1038/s41534-022-00622-3· OSTI ID:1982122

^[1]; Hamo, Assaf ^[2]; ^[1]; ^[3]; ^[1]

Harvard Univ., Cambridge, MA (United States)
Bar-Ilan Univ., Ramat Gan (Israel)
Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States); Harvard Univ., Cambridge, MA (United States)

Nitrogen-vacancy (NV) center in diamond is a promising quantum sensor with remarkably versatile sensing capabilities. While scanning NV magnetometry is well-established, NV electrometry has been so far limited to bulk diamonds. Here we demonstrate imaging external alternating (AC) and direct (DC) electric fields with a single NV at the apex of a diamond scanning tip under ambient conditions. A strong electric field screening effect is observed at low frequencies. We quantitatively measure its frequency dependence and overcome this screening by mechanically oscillating the tip for imaging DC fields. Our scanning NV electrometry achieved an AC E-field sensitivity of 26 mV μm^-1 Hz^-1/2, a DC E-field gradient sensitivity of 2 V μm^-2 Hz^-1/2, and sub-100 nm resolution limited by the NV-sample distance. Our work represents an important step toward building a scanning-probe-based multimodal quantum sensing platform.

View Accepted Manuscript (DOE)

Research Organization:: National Quantum Information Science (QIS) Research Centers (United States). The Quantum Science Center (QSC)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1982122

Journal Information:: npj Quantum Information, Journal Name: npj Quantum Information Journal Issue: 1 Vol. 8; ISSN 2056-6387

Publisher:: Nature Partner JournalsCopyright Statement

Country of Publication:: United States

Language:: English

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