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Office of Scientific and Technical Information
 

Evidence of Interface Trap Build-up Irradiated 14nm Bulk FinFET Technologies.

Conference ·
DOI:https://doi.org/10.2172/1831025· OSTI ID:1831025
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Abstract not provided.

Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
NA0003525
OSTI ID:
1831025
Report Number(s):
SAND2020-11791C; 691964
Country of Publication:
United States
Language:
English

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