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Office of Scientific and Technical Information
 

Evidence of Interface trap build-up irradiated 14nm Bulk FinFET Technologies.

Conference ·
OSTI ID:1825615
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Abstract not provided.

Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
NA0003525
OSTI ID:
1825615
Report Number(s):
SAND2020-10812C; 691309
Country of Publication:
United States
Language:
English

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