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Epitaxial Ferroelectric Hf0.5Zr0.5O2 with Metallic Pyrochlore Oxide Electrodes

Journal Article · · Advanced Materials
 [1];  [2];  [3];  [4];  [5];  [5];  [6];  [5];  [5];  [5];  [5];  [7];  [8];  [9];  [10];  [6];  [5];  [11];  [5]
  1. Univ. of California, Berkeley, CA (United States); Penn State University
  2. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of California, Berkeley, CA (United States)
  3. Argonne National Lab. (ANL), Lemont, IL (United States)
  4. Cornell Univ., Ithaca, NY (United States)
  5. Univ. of California, Berkeley, CA (United States)
  6. Pennsylvania State Univ., University Park, PA (United States)
  7. EMD Performance Materials, San Jose, CA (United States)
  8. Asylum Research, Goleta, CA (United States)
  9. Univ. of Nebraska, Lincoln, NE (United States)
  10. Cornell Univ., Ithaca, NY (United States); Kavli Inst. at Cornell for Nanoscale Science, Ithaca, NY (United States)
  11. Univ. of California, Berkeley, CA (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
The synthesis of fully epitaxial ferroelectric Hf0.5Zr0.5O2 (HZO) thin films through the use of a conducting pyrochlore oxide electrode that acts as a structural and chemical template is reported. Such pyrochlores, exemplified by Pb2Ir2O7(PIO) and Bi2Ru2O7(BRO), exhibit metallic conductivity with room-temperature resistivity of <1 mΩ cm and are closely lattice matched to yttria-stabilized zirconia substrates as well as the HZO layers grown on top of them. Evidence for epitaxy and domain formation is established with X-ray diffraction and scanning transmission electron microscopy, which show that the c-axis of the HZO film is normal to the substrate surface. The emergence of the non-polar-monoclinic phase from the polar-orthorhombic phase is observed when the HZO film thickness is ≥≈30 nm. Furthermore, thermodynamic analyses reveal the role of epitaxial strain and surface energy in stabilizing the polar phase as well as its coexistence with the non-polar-monoclinic phase as a function of film thickness.
Research Organization:
Pennsylvania State Univ., University Park, PA (United States)
Sponsoring Organization:
USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
AC02-06CH11357; SC0012375
OSTI ID:
1806287
Alternate ID(s):
OSTI ID: 1785882
Journal Information:
Advanced Materials, Journal Name: Advanced Materials Journal Issue: 10 Vol. 33; ISSN 0935-9648
Publisher:
WileyCopyright Statement
Country of Publication:
United States
Language:
English

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