Probing subwavelength in-plane anisotropy with antenna-assisted infrared nano-spectroscopy

Yao, Ziheng; Chen, Xinzhong; Wehmeier, Lukas; Xu, Suheng; Shao, Yinming; Zeng, Zimeng; Liu, Fanwei; Mcleod, Alexander S.; Gilbert Corder, Stephanie N.; Tsuneto, Makoto; Shi, Wu; Wang, Zihang; Zheng, Wenjun; Bechtel, Hans A.; Carr, G. Larry; Martin, Michael C.; Zettl, Alex; Basov, D. N.; Chen, Xi; Eng, Lukas M.; Kehr, Susanne C.; Liu, Mengkun

doi:10.1038/s41467-021-22844-3

Title: Probing subwavelength in-plane anisotropy with antenna-assisted infrared nano-spectroscopy

Journal Article · Tue May 11 00:00:00 EDT 2021 · Nature Communications

DOI:https://doi.org/10.1038/s41467-021-22844-3· OSTI ID:1805271

^[1]; Chen, Xinzhong ^[2];

^[3]; Xu, Suheng ^[4];

^[5]; Zeng, Zimeng ^[6]; Liu, Fanwei ^[6];

^[5]; Gilbert Corder, Stephanie N. ^[7]; Tsuneto, Makoto ^[2];

^[8]; Wang, Zihang ^[9]; Zheng, Wenjun ^[2];

^[7]; Carr, G. Larry ^[10];

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Stony Brook Univ., NY (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Stony Brook Univ., NY (United States)
Technische Univ. Dresden (Germany)
Stony Brook Univ., NY (United States); Columbia Univ., New York, NY (United States)
Columbia Univ., New York, NY (United States)
Tsinghua Univ., Beijing (China)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of California, Berkeley, CA (United States); Fudan Univ., Shanghai (China)
Univ. of California, Berkeley, CA (United States)
Brookhaven National Lab. (BNL), Upton, NY (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of California, Berkeley, CA (United States)
Stony Brook Univ., NY (United States); Brookhaven National Lab. (BNL), Upton, NY (United States)

Infrared nano-spectroscopy based on scattering-type scanning near-field optical microscopy (s-SNOM) is commonly employed to probe the vibrational fingerprints of materials at the nanometer length scale. However, due to the elongated and axisymmetric tip shank, s-SNOM is less sensitive to the in-plane sample anisotropy in general. In this article, we report an easy-to-implement method to probe the in-plane dielectric responses of materials with the assistance of a metallic disk micro-antenna. As a proof-of-concept demonstration, we investigate here the in-plane phonon responses of two prototypical samples, i.e. in (100) sapphire and x-cut lithium niobate (LiNbO₃). In particular, the sapphire in-plane vibrations between 350 cm–1 to 800 cm–1 that correspond to LO phonon modes along the crystal b- and c-axis are determined with a spatial resolution of < λ/10, without needing any fitting parameters. In LiNbO₃, we identify the in-plane orientation of its optical axis via the phonon modes, demonstrating that our method can be applied without prior knowledge of the crystal orientation. Furthermore, our method can be elegantly adapted to retrieve the in-plane anisotropic response of a broad range of materials, i.e. subwavelength microcrystals, van-der-Waals materials, or topological insulators.

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Research Organization:: Brookhaven National Lab. (BNL), Upton, NY (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division

Grant/Contract Number:: SC0012704; AC02-05CH11231; 05K16ODA; 05K19ODB

OSTI ID:: 1805271

Alternate ID(s):: OSTI ID: 1807507

Report Number(s):: BNL-221737-2021-JAAM

Journal Information:: Nature Communications, Vol. 12, Issue 1; ISSN 2041-1723

Publisher:: Nature Publishing GroupCopyright Statement

Country of Publication:: United States

Language:: English

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