Phonon-induced near-field resonances in multiferroic BiFeO3 thin films at infrared and THz wavelengths

Wehmeier, Lukas; Nörenberg, Tobias; de Oliveira, Thales V. A. G.; Klopf, J. Michael; Yang, Seung-Yeul; Martin, Lane W.; Ramesh, Ramamoorthy; Eng, Lukas M.; Kehr, Susanne C.

doi:10.1063/1.5133116

Phonon-induced near-field resonances in multiferroic BiFeO₃ thin films at infrared and THz wavelengths

Journal Article · Tue Feb 18 00:00:00 EST 2020 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.5133116· OSTI ID:1633262

^[1]; Nörenberg, Tobias ^[1]; ^[2]; Klopf, J. Michael ^[3]; Yang, Seung-Yeul ^[4]; ^[5]; Ramesh, Ramamoorthy ^[5]; ^[6]; Kehr, Susanne C. ^[1]

Technische Univ. Dresden (Germany). Institute of Applied Physics
Technische Univ. Dresden (Germany). Institute of Applied Physics; Helmholtz-Zentrum Dresden-Rossendorf, Dresden (Germany). Institute of Radiation Physics
Helmholtz-Zentrum Dresden-Rossendorf, Dresden (Germany). Institute of Radiation Physics
SanDisk, Western Digital Technologies Inc., Milpitas, CA (United States)
Univ. of California, Berkeley, CA (United States)
Technische Univ. Dresden (Germany). Institute of Applied Physics and Dresden-Wurzburg Cluster of Excellence-EXC 2147

Multiferroic BiFeO$$_3$$ (BFO) shows several phonon modes at infrared (IR) to THz energies, which are expected to carry information on any sample property coupled to crystal lattice vibrations. While macroscopic IR studies of BFO are often limited by single-crystal size, scattering-type scanning near-field optical microscopy (s-SNOM) allows for IR thin film spectroscopy of nanoscopic probing volumes with negligible direct substrate contribution to the optical signal. In fact, polaritons such as phonon polaritons of BFO introduce a resonant tip–sample coupling in s-SNOM, leading to both stronger signals and enhanced sensitivity to local material properties. Here in this paper, we explore the near-field response of BFO thin films at three consecutive resonances (centered around 5 THz, 13 THz, and 16 THz), by combining s-SNOM with a free-electron laser. We study the dependence of these near-field resonances on both the wavelength and tip–sample distance. Enabled by the broad spectral range of the measurement, we probe phonon modes connected to the predominant motion of either the bismuth or oxygen ions. Therefore, we propose s-SNOM at multiple near-field resonances as a versatile and very sensitive tool for the simultaneous investigation of various sample properties.

View Accepted Manuscript (DOE)

Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: German Federal Ministry of Education and Research (BMBF); German Research Foundation (DFG); USDOE Office of Science (SC)

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1633262

Journal Information:: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 7 Vol. 116; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

References (53)

Magnetic susceptibility, phonons and dielectric constant of single crystalline BiFeO ₃ Lu, Jun; Schmidt, M.; Lunkenheimer, P. Journal of Physics: Conference Series, Vol. 200, Issue 1 https://doi.org/10.1088/1742-6596/200/1/012106	journal	January 2010
Nanospectroscopy of Infrared Phonon Resonance Enables Local Quantification of Electronic Properties in Doped SrTiO ₃ Ceramics Lewin, Martin; Baeumer, Christoph; Gunkel, Felix Advanced Functional Materials, Vol. 28, Issue 42 https://doi.org/10.1002/adfm.201802834	journal	September 2018
Physics and Applications of Bismuth Ferrite Catalan, Gustau; Scott, James F. Advanced Materials, Vol. 21, Issue 24 https://doi.org/10.1002/adma.200802849	journal	June 2009
Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research Chen, Xinzhong; Hu, Debo; Mescall, Ryan Advanced Materials https://doi.org/10.1002/adma.201804774	journal	April 2019
Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy Knoll, Bernhard; Keilmann, Fritz Optics Communications, Vol. 182, Issue 4-6 https://doi.org/10.1016/S0030-4018(00)00826-9	journal	August 2000
Far Infrared Synchrotron Near-Field Nanoimaging and Nanospectroscopy Khatib, Omar; Bechtel, Hans A.; Martin, Michael C. ACS Photonics, Vol. 5, Issue 7 https://doi.org/10.1021/acsphotonics.8b00565	journal	December 2017
Nanomechanical Resonance Tuning and Phase Effects in Optical Near-Field Interaction Taubner, T.; Keilmann, F.; Hillenbrand, R. Nano Letters, Vol. 4, Issue 9 https://doi.org/10.1021/nl0491677	journal	September 2004
Nanoscale Resolved Infrared Probing of Crystal Structure and of Plasmon−Phonon Coupling Huber, A.; Ocelic, N.; Taubner, T. Nano Letters, Vol. 6, Issue 4 https://doi.org/10.1021/nl060092b	journal	April 2006
Subsurface Nanoimaging by Broadband Terahertz Pulse Near-Field Microscopy Moon, Kiwon; Park, Hongkyu; Kim, Jeonghoi Nano Letters, Vol. 15, Issue 1 https://doi.org/10.1021/nl503998v	journal	December 2014
Terahertz Near-Field Nanoscopy of Mobile Carriers in Single Semiconductor Nanodevices Huber, A. J.; Keilmann, F.; Wittborn, J. Nano Letters, Vol. 8, Issue 11 https://doi.org/10.1021/nl802086x	journal	November 2008
Recovery of Permittivity and Depth from Near-Field Data as a Step toward Infrared Nanotomography Govyadinov, Alexander A.; Mastel, Stefan; Golmar, Federico ACS Nano, Vol. 8, Issue 7 https://doi.org/10.1021/nn5016314	journal	June 2014
Near-field probing of vibrational absorption for chemical microscopy Knoll, B.; Keilmann, F. Nature, Vol. 399, Issue 6732 https://doi.org/10.1038/20154	journal	May 1999
Phonon-enhanced light–matter interaction at the nanometre scale Hillenbrand, R.; Taubner, T.; Keilmann, F. Nature, Vol. 418, Issue 6894 https://doi.org/10.1038/nature00899	journal	July 2002
Near-field examination of perovskite-based superlenses and superlens-enhanced probe-object coupling Kehr, S. C.; Liu, Y. M.; Martin, L. W. Nature Communications, Vol. 2, Issue 1 https://doi.org/10.1038/ncomms1249	journal	March 2011
Conduction at domain walls in oxide multiferroics Seidel, J.; Martin, L. W.; He, Q. Nature Materials, Vol. 8, Issue 3 https://doi.org/10.1038/nmat2373	journal	January 2009
Infrared nanoscopy of strained semiconductors Huber, A. J.; Ziegler, A.; Köck, T. Nature Nanotechnology, Vol. 4, Issue 3 https://doi.org/10.1038/nnano.2008.399	journal	January 2009
Above-bandgap voltages from ferroelectric photovoltaic devices Yang, S. Y.; Seidel, J.; Byrnes, S. J. Nature Nanotechnology, Vol. 5, Issue 2 https://doi.org/10.1038/nnano.2009.451	journal	January 2010
Giant energy density and high efficiency achieved in bismuth ferrite-based film capacitors via domain engineering Pan, Hao; Ma, Jing; Ma, Ji Nature Communications, Vol. 9, Issue 1 https://doi.org/10.1038/s41467-018-04189-6	journal	May 2018
Tomographic and multimodal scattering-type scanning near-field optical microscopy with peak force tapping mode Wang, Haomin; Wang, Le; Jakob, Devon S. Nature Communications, Vol. 9, Issue 1 https://doi.org/10.1038/s41467-018-04403-5	journal	May 2018
Low-temperature nanospectroscopy of the structural ferroelectric phases in single-crystalline barium titanate Döring, Jonathan; Lang, Denny; Wehmeier, Lukas Nanoscale, Vol. 10, Issue 37 https://doi.org/10.1039/C8NR04081H	journal	January 2018
Performance of visible and mid-infrared scattering-type near-field optical microscopes Taubner, T.; Hillenbrand, R.; Keilmann, F. Journal of Microscopy, Vol. 210, Issue 3 https://doi.org/10.1046/j.1365-2818.2003.01164.x	journal	June 2003
Apertureless near‐field optical microscope Zenhausern, F.; O’Boyle, M. P.; Wickramasinghe, H. K. Applied Physics Letters, Vol. 65, Issue 13 https://doi.org/10.1063/1.112931	journal	September 1994
A reflection-mode apertureless scanning near-field optical microscope developed from a commercial scanning probe microscope Wurtz, G.; Bachelot, R.; Royer, P. Review of Scientific Instruments, Vol. 69, Issue 4 https://doi.org/10.1063/1.1148834	journal	April 1998
Terahertz imaging with nanometer resolution Chen, Hou-Tong; Kersting, Roland; Cho, Gyu Cheon Applied Physics Letters, Vol. 83, Issue 15 https://doi.org/10.1063/1.1616668	journal	October 2003
Impact of optical in-plane anisotropy on near-field phonon polariton spectroscopy Schneider, S.; Seidel, J.; Grafström, S. Applied Physics Letters, Vol. 90, Issue 14 https://doi.org/10.1063/1.2718489	journal	April 2007
High temperature emissivity, reflectivity, and x-ray absorption of BiFeO3 Massa, Néstor E.; del Campo, Leire; de Souza Meneses, Domingos Journal of Applied Physics, Vol. 108, Issue 8 https://doi.org/10.1063/1.3486515	journal	October 2010
Narrow-band near-field nanoscopy in the spectral range from 1.3 to 8.5 THz Kuschewski, F.; von Ribbeck, H. -G.; Döring, J. Applied Physics Letters, Vol. 108, Issue 11 https://doi.org/10.1063/1.4943793	journal	March 2016
Infrared nanoscopy down to liquid helium temperatures Lang, Denny; Döring, Jonathan; Nörenberg, Tobias Review of Scientific Instruments, Vol. 89, Issue 3 https://doi.org/10.1063/1.5016281	journal	March 2018
FEL-Based Near-Field Infrared to THz Nanoscopy Kehr, Susanne C.; Döring, Jonathan; Gensch, Michael Synchrotron Radiation News, Vol. 30, Issue 4 https://doi.org/10.1080/08940886.2017.1338421	journal	July 2017
Near-field microscopy by elastic light scattering from a tip Keilmann, Fritz; Hillenbrand, Rainer Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences, Vol. 362, Issue 1817 https://doi.org/10.1098/rsta.2003.1347	journal	April 2004
Polarization-dependent near-field phonon nanoscopy of oxides: SrTiO 3 , LiNbO 3 , and PbZr 0.2 Ti 0.8 O 3 Wehmeier, Lukas; Lang, Denny; Liu, Yongmin Physical Review B, Vol. 100, Issue 3 https://doi.org/10.1103/PhysRevB.100.035444	journal	July 2019
Resonance shift effects in apertureless scanning near-field optical microscopy Porto, J. A.; Johansson, P.; Apell, S. P. Physical Review B, Vol. 67, Issue 8 https://doi.org/10.1103/PhysRevB.67.085409	journal	February 2003
Scattering near-field optical microscopy of optically anisotropic systems Schneider, S. C.; Grafström, S.; Eng, L. M. Physical Review B, Vol. 71, Issue 11 https://doi.org/10.1103/PhysRevB.71.115418	journal	March 2005
Infrared and terahertz studies of polar phonons and magnetodielectric effect in multiferroic Bi Fe O 3 ceramics Kamba, S.; Nuzhnyy, D.; Savinov, M. Physical Review B, Vol. 75, Issue 2 https://doi.org/10.1103/PhysRevB.75.024403	journal	January 2007
Raman and infrared spectra of multiferroic bismuth ferrite from first principles Hermet, P.; Goffinet, M.; Kreisel, J. Physical Review B, Vol. 75, Issue 22 https://doi.org/10.1103/PhysRevB.75.220102	journal	June 2007
Infrared phonon dynamics of a multiferroic Bi Fe O 3 single crystal Lobo, R. P. S. M.; Moreira, R. L.; Lebeugle, D. Physical Review B, Vol. 76, Issue 17 https://doi.org/10.1103/PhysRevB.76.172105	journal	November 2007
Broadband-infrared assessment of phonon resonance in scattering-type near-field microscopy Amarie, S.; Keilmann, F. Physical Review B, Vol. 83, Issue 4 https://doi.org/10.1103/PhysRevB.83.045404	journal	January 2011
Near-field spectroscopy of silicon dioxide thin films Zhang, L. M.; Andreev, G. O.; Fei, Z. Physical Review B, Vol. 85, Issue 7 https://doi.org/10.1103/PhysRevB.85.075419	journal	February 2012
Spin and lattice excitations of a BiFeO 3 thin film and ceramics Skiadopoulou, S.; Goian, V.; Kadlec, C. Physical Review B, Vol. 91, Issue 17 https://doi.org/10.1103/PhysRevB.91.174108	journal	May 2015
Anisotropy Contrast in Phonon-Enhanced Apertureless Near-Field Microscopy Using a Free-Electron Laser Kehr, S. C.; Cebula, M.; Mieth, O. Physical Review Letters, Vol. 100, Issue 25 https://doi.org/10.1103/PhysRevLett.100.256403	journal	June 2008
Scanning plasmon near-field microscope Specht, M.; Pedarnig, J. D.; Heckl, W. M. Physical Review Letters, Vol. 68, Issue 4 https://doi.org/10.1103/PhysRevLett.68.476	journal	January 1992
Epitaxial BiFeO₃ Multiferroic Thin Film Heterostructures Wang, J.; Neaton, J. B.; Zheng, H. Science, Vol. 299, Issue 5613, p. 1719-1722 https://doi.org/10.1126/science.1080615	journal	March 2003
APPLIED PHYSICS: Toward Bridging the Terahertz Gap with Silicon-Based Lasers Borak, A. Science, Vol. 308, Issue 5722 https://doi.org/10.1126/science.1109831	journal	April 2005
Optical properties of BiFeO3 ceramics in the frequency range 0.3–30.0 THz Komandin, G. A.; Torgashev, V. I.; Volkov, A. A. Physics of the Solid State, Vol. 52, Issue 4 https://doi.org/10.1134/S1063783410040104	journal	April 2010
Spectroscopic THz near-field microscope von Ribbeck, H. -G.; Brehm, M.; van der Weide, D. W. Optics Express, Vol. 16, Issue 5 https://doi.org/10.1364/OE.16.003430	journal	January 2008
Quantitative determination of the charge carrier concentration of ion implanted silicon by IR-near-field spectroscopy Jacob, Rainer; Winnerl, Stephan; Schneider, Harald Optics Express, Vol. 18, Issue 25 https://doi.org/10.1364/OE.18.026206	journal	January 2010
Exploring the detection limits of infrared near-field microscopy regarding small buried structures and pushing them by exploiting superlens-related effects Jung, Lena; Hauer, Benedikt; Li, Peining Optics Express, Vol. 24, Issue 5 https://doi.org/10.1364/OE.24.004431	journal	January 2016
Broadband near-field infrared spectroscopy with a high temperature plasma light source Lahneman, D. J.; Huffman, T. J.; Xu, Peng Optics Express, Vol. 25, Issue 17 https://doi.org/10.1364/OE.25.020421	journal	January 2017
Phase-resolved terahertz self-detection near-field microscopy Giordano, Maria C.; Mastel, Stefan; Liewald, Clemens Optics Express, Vol. 26, Issue 14 https://doi.org/10.1364/OE.26.018423	journal	January 2018
Hyperspectral time-domain terahertz nano-imaging Aghamiri, Neda Alsadat; Huth, Florian; Huber, Andreas J. Optics Express, Vol. 27, Issue 17 https://doi.org/10.1364/OE.27.024231	journal	January 2019
Near-field scanning optical microscope with a metallic probe tip Inouye, Yasushi; Kawata, Satoshi Optics Letters, Vol. 19, Issue 3 https://doi.org/10.1364/OL.19.000159	journal	January 1994
Nanoscale-resolved subsurface imaging by scattering-type near-field optical microscopy Taubner, T.; Keilmann, F.; Hillenbrand, R. Optics Express, Vol. 13, Issue 22 https://doi.org/10.1364/OPEX.13.008893	journal	January 2005
All-electronic terahertz nanoscopy Liewald, Clemens; Mastel, Stefan; Hesler, Jeffrey Optica, Vol. 5, Issue 2 https://doi.org/10.1364/OPTICA.5.000159	journal	January 2018

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