Probe-induced soft sample damage in atomic force microscopy (AFM), as well as the resulting alteration of local mechanical and electrical properties of the material are explored, specifically comparing contact-mode and intermittent-contact-mode imaging methods. In our experiments, performed on conductive polymer films, induced changes are present in contact-mode imaging while they are negligible or absent in tapping-mode imaging. Here, to understand this result, a viscoelastic parameter extraction is performed, which suggests that permanent sample deformation can readily occur for tip-sample interactions with a duration on the timescale of contact-mode interactions. Using the extracted viscoelastic parameters, a dynamic AFM simulation is conducted, which suggests that the material responds more elastically with reduced or absent sample damage in tapping-mode AFM, due to the higher rate of mechanical deformation and shorter timescales.
Saadi, M. R., et al. "Soft sample deformation, damage and induced electromechanical property changes in contact- and tapping-mode atomic force microscopy." Surface Topography: Metrology and Properties (Online), vol. 8, no. 4, Oct. 2020. https://doi.org/10.1088/2051-672x/abb888
Saadi, M. R., Uluutku, Berkin, Parvini, Cameron H., & Solares, Santiago D. (2020). Soft sample deformation, damage and induced electromechanical property changes in contact- and tapping-mode atomic force microscopy. Surface Topography: Metrology and Properties (Online), 8(4). https://doi.org/10.1088/2051-672x/abb888
Saadi, M. R., Uluutku, Berkin, Parvini, Cameron H., et al., "Soft sample deformation, damage and induced electromechanical property changes in contact- and tapping-mode atomic force microscopy," Surface Topography: Metrology and Properties (Online) 8, no. 4 (2020), https://doi.org/10.1088/2051-672x/abb888
@article{osti_1696774,
author = {Saadi, M. R. and Uluutku, Berkin and Parvini, Cameron H. and Solares, Santiago D.},
title = {Soft sample deformation, damage and induced electromechanical property changes in contact- and tapping-mode atomic force microscopy},
annote = {Probe-induced soft sample damage in atomic force microscopy (AFM), as well as the resulting alteration of local mechanical and electrical properties of the material are explored, specifically comparing contact-mode and intermittent-contact-mode imaging methods. In our experiments, performed on conductive polymer films, induced changes are present in contact-mode imaging while they are negligible or absent in tapping-mode imaging. Here, to understand this result, a viscoelastic parameter extraction is performed, which suggests that permanent sample deformation can readily occur for tip-sample interactions with a duration on the timescale of contact-mode interactions. Using the extracted viscoelastic parameters, a dynamic AFM simulation is conducted, which suggests that the material responds more elastically with reduced or absent sample damage in tapping-mode AFM, due to the higher rate of mechanical deformation and shorter timescales.},
doi = {10.1088/2051-672x/abb888},
url = {https://www.osti.gov/biblio/1696774},
journal = {Surface Topography: Metrology and Properties (Online)},
issn = {ISSN 2051-672X},
number = {4},
volume = {8},
place = {United States},
publisher = {IOP Publishing},
year = {2020},
month = {10}}
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