Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis

Uluutku, Berkin; Solares, Santiago D.

doi:10.3762/bjnano.11.37

Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis

Journal Article · Fri Mar 13 00:00:00 EDT 2020 · Beilstein Journal of Nanotechnology

DOI:https://doi.org/10.3762/bjnano.11.37· OSTI ID:1603485

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George Washington Univ., Washington, DC (United States). Dept. of Mechanical and Aerospace Engineering; The George Washington University
George Washington Univ., Washington, DC (United States). Dept. of Mechanical and Aerospace Engineering

Atomic force microscopy (AFM) is an important tool for measuring a variety of nanoscale surface properties, such as topography, viscoelasticity, electrical potential and conductivity. Some of these properties are measured using contact methods (static contact or intermittent contact), while others are measured using noncontact methods. Some properties can be measured using different approaches. Conductivity, in particular, is mapped using the contact-mode method. However, this modality can be destructive to delicate samples, since it involves continuously dragging the cantilever tip on the surface during the raster scan, while a constant tip–sample force is applied. In this paper we discuss a possible approach to develop an intermittent-contact conductive AFM mode based on Fourier analysis, whereby the measured current response consists of higher harmonics of the cantilever oscillation frequency. Such an approach may enable the characterization of soft samples with less damage than contact-mode imaging. To explore its feasibility, we derive the analytical form of the tip–sample current that would be obtained for attractive (noncontact) and repulsive (intermittent-contact) dynamic AFM characterization, and compare it with results obtained from numerical simulations. Although significant instrumentation challenges are anticipated, the modelling results are promising and suggest that Fourier-based higher-harmonics current measurement may enable the development of a reliable intermittent-contact conductive AFM method.

View Accepted Manuscript (DOE)

Research Organization:: George Washington Univ., Washington, DC (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)

Grant/Contract Number:: SC0018041

OSTI ID:: 1603485

Journal Information:: Beilstein Journal of Nanotechnology, Journal Name: Beilstein Journal of Nanotechnology Vol. 11; ISSN BJNEAH; ISSN 2190-4286

Publisher:: Beilstein InstituteCopyright Statement

Country of Publication:: United States

Language:: English

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Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis

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