Material property analytical relations for the case of an AFM probe tapping a viscoelastic surface containing multiple characteristic times
- George Washington Univ., Washington, DC (United States). Dept. of Mechanical and Aerospace Engineering; Department of Mechanical and Aerospace Engineering, The George Washington University, Washington, DC 20052, USA
- George Washington Univ., Washington, DC (United States). Dept. of Mechanical and Aerospace Engineering
We explore the contact problem of a flat-end indenter penetrating intermittently a generalized viscoelastic surface, containing multiple characteristic times. This problem is especially relevant for nanoprobing of viscoelastic surfaces with the highly popular tapping-mode AFM imaging technique. By focusing on the material perspective and employing a rigorous rheological approach, we deliver analytical closed-form solutions that provide physical insight into the viscoelastic sources of repulsive forces, tip-sample dissipation and virial of the interaction. We also offer a systematic comparison to the well-established standard harmonic excitation, which is the case relevant for dynamic mechanical analysis (DMA) and for AFM techniques where tip–sample sinusoidal interaction is permanent. This comparison highlights the substantial complexity added by the intermittent-contact nature of the interaction, which precludes the derivation of straightforward equations as is the case for the well-known harmonic excitations. The derivations offered have been thoroughly validated through numerical simulations. Despite the complexities inherent to the intermittent-con-tact nature of the technique, the analytical findings highlight the potential feasibility of extracting meaningful viscoelastic properties with this imaging method.
- Research Organization:
- George Washington Univ., Washington, DC (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
- Grant/Contract Number:
- SC0011912
- OSTI ID:
- 1502935
- Journal Information:
- Beilstein Journal of Nanotechnology, Journal Name: Beilstein Journal of Nanotechnology Vol. 8; ISSN 2190-4286; ISSN BJNEAH
- Publisher:
- Beilstein InstituteCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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