Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: Coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions

Solares, Santiago D.

doi:10.3762/bjnano.7.49

Title: Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: Coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions

Journal Article · Fri Apr 15 00:00:00 EDT 2016 · Beilstein Journal of Nanotechnology

DOI:https://doi.org/10.3762/bjnano.7.49· OSTI ID:1262033

Solares, Santiago D. ^[1]

George Washington Univ., Washington, DC (United States)

Significant progress has been accomplished in the development of experimental contact-mode and dynamic-mode atomic force microscopy (AFM) methods designed to measure surface material properties. However, current methods are based on one-dimensional (1D) descriptions of the tip-sample interaction forces, thus neglecting the intricacies involved in the material behavior of complex samples (such as soft viscoelastic materials) as well as the differences in material response between the surface and the bulk. In order to begin to address this gap, a computational study is presented where the sample is simulated using an enhanced version of a recently introduced model that treats the surface as a collection of standard-linear-solid viscoelastic elements. The enhanced model introduces in-plane surface elastic forces that can be approximately related to a two-dimensional (2D) Young's modulus. Relevant cases are discussed for single-and multifrequency intermittent-contact AFM imaging, with focus on the calculated surface indentation profiles and tip-sample interaction force curves, as well as their implications with regards to experimental interpretation. A variety of phenomena are examined in detail, which highlight the need for further development of more physically accurate sample models that are specifically designed for AFM simulation. As a result, a multifrequency AFM simulation tool based on the above sample model is provided as supporting information.

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Research Organization:: George Washington Univ., Washington, DC (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC0011912

OSTI ID:: 1262033

Journal Information:: Beilstein Journal of Nanotechnology, Vol. 7; ISSN 2190-4286

Publisher:: Beilstein InstituteCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 18 works

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References (31)

Energy dissipation in tapping-mode atomic force microscopy Cleveland, J. P.; Anczykowski, B.; Schmid, A. E. Applied Physics Letters, Vol. 72, Issue 20 https://doi.org/10.1063/1.121434	journal	May 1998
Vibrations of free and surface‐coupled atomic force microscope cantilevers: Theory and experiment Rabe, U.; Janser, K.; Arnold, W. Review of Scientific Instruments, Vol. 67, Issue 9 https://doi.org/10.1063/1.1147409	journal	September 1996
Contact-resonance atomic force microscopy for viscoelasticity Yuya, P. A.; Hurley, D. C.; Turner, J. A. Journal of Applied Physics, Vol. 104, Issue 7 https://doi.org/10.1063/1.2996259	journal	January 2008
Viscoelastic Property Mapping with Contact Resonance Force Microscopy Killgore, J. P.; Yablon, D. G.; Tsou, A. H. Langmuir, Vol. 27, Issue 23 https://doi.org/10.1021/la203434w	journal	December 2011
Nanoscale mapping of contact stiffness and damping by contact resonance atomic force microscopy Stan, Gheorghe; King, Sean W.; Cook, Robert F. Nanotechnology, Vol. 23, Issue 21 https://doi.org/10.1088/0957-4484/23/21/215703	journal	May 2012
The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale Jesse, Stephen; Kalinin, Sergei V.; Proksch, Roger Nanotechnology, Vol. 18, Issue 43 https://doi.org/10.1088/0957-4484/18/43/435503	journal	September 2007
Measurement and interpretation of elastic and viscoelastic properties with the atomic force microscope Attard, Phil Journal of Physics: Condensed Matter, Vol. 19, Issue 47 https://doi.org/10.1088/0953-8984/19/47/473201	journal	November 2007
The emergence of multifrequency force microscopy Garcia, Ricardo; Herruzo, Elena T. Nature Nanotechnology, Vol. 7, Issue 4 https://doi.org/10.1038/nnano.2012.38	journal	April 2012
Fast nanomechanical spectroscopy of soft matter Herruzo, Elena T.; Perrino, Alma P.; Garcia, Ricardo Nature Communications, Vol. 5, Issue 1 https://doi.org/10.1038/ncomms4126	journal	January 2014
The role of nonlinear dynamics in quantitative atomic force microscopy Platz, Daniel; Forchheimer, Daniel; Tholén, Erik A. Nanotechnology, Vol. 23, Issue 26 https://doi.org/10.1088/0957-4484/23/26/265705	journal	June 2012
Reconstruction of tip-surface interactions with multimodal intermodulation atomic force microscopy Borysov, Stanislav S.; Platz, Daniel; de Wijn, Astrid S. Physical Review B, Vol. 88, Issue 11 https://doi.org/10.1103/PhysRevB.88.115405	journal	September 2013
Modeling viscoelasticity through spring–dashpot models in intermittent-contact atomic force microscopy López-Guerra, Enrique A.; Solares, Santiago D. Beilstein Journal of Nanotechnology, Vol. 5 https://doi.org/10.3762/bjnano.5.224	journal	January 2014
Probing viscoelastic surfaces with bimodal tapping-mode atomic force microscopy: Underlying physics and observables for a standard linear solid model Solares, Santiago D. Beilstein Journal of Nanotechnology, Vol. 5 https://doi.org/10.3762/bjnano.5.176	journal	January 2014
An atomic force microscope tip designed to measure time-varying nanomechanical forces Sahin, Ozgur; Magonov, Sergei; Su, Chanmin Nature Nanotechnology, Vol. 2, Issue 8 https://doi.org/10.1038/nnano.2007.226	journal	July 2007
Dynamic atomic force microscopy methods García, R. Surface Science Reports, Vol. 47, Issue 6-8 https://doi.org/10.1016/S0167-5729(02)00077-8	journal	September 2002
Dynamic mechanical analysis of ethylene-propylene-diene monomer rubber and styrene-butadiene rubber blends Nair, T. Muraleedharan; Kumaran, M. G.; Unnikrishnan, G. Journal of Applied Polymer Science, Vol. 112, Issue 1 https://doi.org/10.1002/app.29367	journal	April 2009
Using force modulation to image surface elasticities with the atomic force microscope Maivald, P.; Butt, H. J.; Gould, S. A. C. Nanotechnology, Vol. 2, Issue 2 https://doi.org/10.1088/0957-4484/2/2/004	journal	April 1991
A simple and efficient quasi 3-dimensional viscoelastic model and software for simulation of tapping-mode atomic force microscopy Solares, Santiago D. Beilstein Journal of Nanotechnology, Vol. 6 https://doi.org/10.3762/bjnano.6.229	journal	January 2015
Probing of Polymer Surfaces in the Viscoelastic Regime Chyasnavichyus, Marius; Young, Seth L.; Tsukruk, Vladimir V. Langmuir, Vol. 30, Issue 35 https://doi.org/10.1021/la404925h	journal	February 2014
Measuring the loss tangent of polymer materials with atomic force microscopy based methods Yablon, Dalia G.; Grabowski, Jean; Chakraborty, Ishita Measurement Science and Technology, Vol. 25, Issue 5 https://doi.org/10.1088/0957-0233/25/5/055402	journal	March 2014
Inverting dynamic force microscopy: From signals to time-resolved interaction forces Stark, M.; Stark, R. W.; Heckl, W. M. Proceedings of the National Academy of Sciences, Vol. 99, Issue 13, p. 8473-8478 https://doi.org/10.1073/pnas.122040599	journal	June 2002
Visualizing the Subsurface of Soft Matter: Simultaneous Topographical Imaging, Depth Modulation, and Compositional Mapping with Triple Frequency Atomic Force Microscopy Ebeling, Daniel; Eslami, Babak; Solares, Santiago De Jesus ACS Nano, Vol. 7, Issue 11 https://doi.org/10.1021/nn404845q	journal	October 2013
Density Functional Theory Study of the Geometry, Energetics, and Reconstruction Process of Si(111) Surfaces Solares, Santiago D.; Dasgupta, Siddharth; Schultz, Peter A. Langmuir, Vol. 21, Issue 26 https://doi.org/10.1021/la052029s	journal	December 2005
Structural analysis of Si(111)‐7×7 by UHV‐transmission electron diffraction and microscopy Takayanagi, K.; Tanishiro, Y.; Takahashi, M. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 3, Issue 3 https://doi.org/10.1116/1.573160	journal	May 1985
Structure analysis of Si(111)-7 × 7 reconstructed surface by transmission electron diffraction Takayanagi, Kunio; Tanishiro, Yasumasa; Takahashi, Shigeki Surface Science, Vol. 164, Issue 2-3 https://doi.org/10.1016/0039-6028(85)90753-8	journal	December 1985
Nanoscale Interfacial Friction and Adhesion on Supported versus Suspended Monolayer and Multilayer Graphene Deng, Zhao; Klimov, Nikolai N.; Solares, Santiago D. Langmuir, Vol. 29, Issue 1 https://doi.org/10.1021/la304079a	journal	December 2012
Multi-frequency tapping-mode atomic force microscopy beyond three eigenmodes in ambient air Solares, Santiago D.; An, Sangmin; Long, Christian J. Beilstein Journal of Nanotechnology, Vol. 5 https://doi.org/10.3762/bjnano.5.175	journal	January 2014
Compositional mapping of surfaces in atomic force microscopy by excitation of the second normal mode of the microcantilever Rodrı́guez, Tomás R.; Garcı́a, Ricardo Applied Physics Letters, Vol. 84, Issue 3 https://doi.org/10.1063/1.1642273	journal	January 2004
Invited Article: VEDA: A web-based virtual environment for dynamic atomic force microscopy Melcher, John; Hu, Shuiqing; Raman, Arvind Review of Scientific Instruments, Vol. 79, Issue 6 https://doi.org/10.1063/1.2938864	journal	June 2008
Dynamic force microscopy simulator (dForce): A tool for planning and understanding tapping and bimodal AFM experiments Guzman, Horacio V.; Garcia, Pablo D.; Garcia, Ricardo Beilstein Journal of Nanotechnology, Vol. 6 https://doi.org/10.3762/bjnano.6.36	journal	January 2015
Nanoscale mechanics by tomographic contact resonance atomic force microscopy Stan, Gheorghe; Solares, Santiago D.; Pittenger, Bede Nanoscale, Vol. 6, Issue 2 https://doi.org/10.1039/c3nr04981g	journal	January 2014

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Transverse viscoelastic properties of pulp fibers investigated with an atomic force microscopy method Czibula, Caterina; Ganser, Christian; Seidlhofer, Tristan Journal of Materials Science, Vol. 54, Issue 17 https://doi.org/10.1007/s10853-019-03707-1	journal	May 2019
Theory of Single-Impact Atomic Force Spectroscopy in liquids with material contrast López-Guerra, Enrique A.; Banfi, Francesco; Solares, Santiago D. Scientific Reports, Vol. 8, Issue 1 https://doi.org/10.1038/s41598-018-25828-4	journal	May 2018
Combining adhesive contact mechanics with a viscoelastic material model to probe local material properties by AFM Ganser, Christian; Czibula, Caterina; Tscharnuter, Daniel Soft Matter, Vol. 14, Issue 1 https://doi.org/10.1039/c7sm02057k	journal	January 2018
Determination of the viscoelastic properties of a single cell cultured on a rigid support by force microscopy Garcia, Pablo D.; Garcia, Ricardo Nanoscale, Vol. 10, Issue 42 https://doi.org/10.1039/c8nr05899g	journal	January 2018
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Material property analytical relations for the case of an AFM probe tapping a viscoelastic surface containing multiple characteristic times López-Guerra, Enrique A.; Solares, Santiago D. Beilstein Journal of Nanotechnology, Vol. 8 https://doi.org/10.3762/bjnano.8.223	journal	January 2017
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36 MATERIALS SCIENCE
atomic force microscopy
modeling
polymers
simulation
spectroscopy
standard linear solid
surface elasticity
surface energy
viscoelasticity
SI(111)-7X7

Title: Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: Coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions

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