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Genome Assembly of Shigella flexneri ATCC 12022, a Quality Control Reference Strain

Journal Article · · Genome Announcements
 [1];  [2];  [3];  [4];  [5];  [2];  [2];  [6];  [2];  [4]; ;  [6];  [2];  [2];  [2];  [4];  [5];  [2]
  1. Los Alamos National Lab. (LANL), Los Alamos, NM (United States); DOE/OSTI
  2. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
  3. U.S. Army Medical Research Institute of Infectious Diseases (USAMRIID), Fort Detrick, MD (United States). Diagnostic Systems Division (DSD)
  4. Naval Medical Research Center (NMRC)-Frederick, Fort Detrick, MD (United States); Henry M. Jackson Foundation, Bethesda, MD (United States)
  5. U.S. Army Edgewood Chemical Biological Center (ECBC), Aberdeen Proving Ground, MD (United States)
  6. U.S. Army Medical Research Institute of Infectious Diseases (USAMRIID), Fort Detrick, MD (United States). Diagnostic Systems Division (DSD)

Shigella flexneri causes shigellosis, severe and potentially life-threatening diarrhea, and accounts for 18% of shigellosis cases in the United States. Here, we present the 4.51-Mbp genome assembly of S. flexneri ATCC 12022, a quality control and reference strain, in 10 scaffolds.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Biological and Environmental Research (BER). Biological Systems Science Division; Defense Threat Reduction Agency (DTRA), Joint Science and Technology Office
OSTI ID:
1629322
Journal Information:
Genome Announcements, Journal Name: Genome Announcements Journal Issue: 5 Vol. 2; ISSN 2169-8287
Publisher:
American Society for MicrobiologyCopyright Statement
Country of Publication:
United States
Language:
English

References (9)

Genome sequencing in microfabricated high-density picolitre reactors journal July 2005
Trends in Population‐Based Active Surveillance for Shigellosis and Demographic Variability in FoodNet Sites, 1996–1999 journal April 2004
An Outbreak of Shigellosis aboard a Cruise Ship caused by a Multiple-antibiotic-resistant Strain of Shigella flexneri journal August 1991
Velvet: Algorithms for de novo short read assembly using de Bruijn graphs journal February 2008
ALLPATHS: De novo assembly of whole-genome shotgun microreads journal February 2008
Base-Calling of Automated Sequencer Traces Using Phred.  I. Accuracy Assessment journal March 1998
Base-Calling of Automated Sequencer Traces Using Phred. II. Error Probabilities journal March 1998
Consed: A Graphical Tool for Sequence Finishing journal March 1998
Solexa Ltd journal June 2004

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