Effect of Perforation on the Thermal and Electrical Breakdown of Self-Rolled-Up Nanomembrane Structures
Journal Article
·
· Advanced Materials Interfaces
- Univ. of Illinois at Urbana-Champaign, IL (United States); University of Illinois at Urbana-Champaign
- Univ. of Illinois at Urbana-Champaign, IL (United States)
Strain-induced self-rolled-up membranes (S-RuM) are structures formed spontaneously by releasing a strained layer or layer stacks from its mechanical support, with unique applications in passive photonics, electronics, and bioengineering. Depending on the thermal properties of the strained layers, these structures can experience various thermally induced deformations. These deformations can be avoided and augmented with the addition of strategically placed perforations in the membrane. This study reports on the use of perforations to modify the thermal effects on strained silicon nitride S-RuM structures. Finally, a programmable fuse with well-defined thermal threshold, ultrasmall footprint, and 2-3 V voltage rating is demonstrated, which can potentially serve as an on-chip sensing device for power electronic circuits.
- Research Organization:
- Univ. of Illinois at Urbana-Champaign, IL (United States)
- Sponsoring Organization:
- National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division
- Grant/Contract Number:
- FG02-07ER46471
- OSTI ID:
- 1607419
- Alternate ID(s):
- OSTI ID: 1560747
- Journal Information:
- Advanced Materials Interfaces, Journal Name: Advanced Materials Interfaces Journal Issue: 21 Vol. 6; ISSN 2196-7350
- Publisher:
- Wiley-VCHCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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