Synchrotron characterization of high-Z, current-mode x-ray detectors

Looker, Quinn; Wood, Michael G.; Miceli, Antonino; Niraula, Madan; Yasuda, Kazuhito; Porter, John L.

doi:10.1063/1.5139403

Synchrotron characterization of high-Z, current-mode x-ray detectors

Journal Article · Wed Feb 12 23:00:00 EST 2020 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.5139403· OSTI ID:1605729

^[1]; ^[1]; Miceli, Antonino ^[2]; Niraula, Madan ^[3]; Yasuda, Kazuhito ^[3]; Porter, John L. ^[1]

Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Argonne National Lab. (ANL), Argonne, IL (United States)
Nagoya Inst. of Technology (Japan)

Fast x-ray detectors are critical tools in pulsed power and fusion applications, where detector impulse response of a nanosecond or better is often required. Semiconductor detectors can create fast, sensitive devices with extensive operational flexibility. There is typically a trade-off between detector sensitivity and speed, but higher atomic number absorbers can increase hard x-ray absorption without increasing the charge collection time, provided carriers achieve high velocity. This paper presents x-ray pulse characterization conducted at the Advanced Photon Source of x-ray absorption efficiency and temporal impulse response of current-mode semiconductor x-ray detectors composed of Si, GaAs, and CdTe.

View Accepted Manuscript (DOE)

Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: AC04-94AL85000

OSTI ID:: 1605729

Alternate ID(s):: OSTI ID: 1614916
OSTI ID: 1599475

Report Number(s):: SAND--2020-2085J; 684048

Journal Information:: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 2 Vol. 91; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

References (14)

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