Raman study of amorphization in nanocrystalline 3C-SiC irradiated with C+ and He+ ions
Journal Article
·
· Journal of Raman Spectroscopy
- Lanzhou University
- BATTELLE (PACIFIC NW LAB)
- Universidade Fedderal do
- VISITORS
This study examines C+ and He+ ion irradiation induced amorphization processes in 3C-SiC nanograins embedded in an amorphous SiC matrix. Raman spectroscopy and Rutherford backscattering spectrometry are used for damage characterization. SiC grains with an average size of either ~6 or ~20 nm were observed to be fully amorphized to a lower dose at room temperature compared to their monocrystalline counterpart under the identical irradiation condition. In addition to damage accumulation induced amorphization in the grains, preferential amorphization at the crystalline/amorphous interfaces could play a significant role. This interface-driven amorphization proceeds at comparable rates for C+ and He+ ion irradiations. The results may have an important implication for nanocrystalline SiC to be applied in advanced nuclear reactors.
- Research Organization:
- Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC05-76RL01830
- OSTI ID:
- 1572470
- Report Number(s):
- PNNL-SA-139648
- Journal Information:
- Journal of Raman Spectroscopy, Journal Name: Journal of Raman Spectroscopy Journal Issue: 8 Vol. 50
- Country of Publication:
- United States
- Language:
- English
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