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Title: Raman study of amorphization in nanocrystalline 3C-SiC irradiated with C+ and He+ ions

Journal Article · · Journal of Raman Spectroscopy
DOI:https://doi.org/10.1002/jrs.5631· OSTI ID:1572470

This study examines C+ and He+ ion irradiation induced amorphization processes in 3C-SiC nanograins embedded in an amorphous SiC matrix. Raman spectroscopy and Rutherford backscattering spectrometry are used for damage characterization. SiC grains with an average size of either ~6 or ~20 nm were observed to be fully amorphized to a lower dose at room temperature compared to their monocrystalline counterpart under the identical irradiation condition. In addition to damage accumulation induced amorphization in the grains, preferential amorphization at the crystalline/amorphous interfaces could play a significant role. This interface-driven amorphization proceeds at comparable rates for C+ and He+ ion irradiations. The results may have an important implication for nanocrystalline SiC to be applied in advanced nuclear reactors.

Research Organization:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-76RL01830
OSTI ID:
1572470
Report Number(s):
PNNL-SA-139648
Journal Information:
Journal of Raman Spectroscopy, Vol. 50, Issue 8
Country of Publication:
United States
Language:
English

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