Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Fundamental Science of Doping and Defects in Ga2O3 for Next Generation Power Semiconductors

Technical Report ·
DOI:https://doi.org/10.2172/1563071· OSTI ID:1563071

The aim and scope of this project was the development of a capability to prepare high-quality, epitaxial beta gallium oxide films by oxide reactive molecular-beam epitaxy. The purpose was to demonstrate that beta gallium oxide could be grown by such a method using Sandia’s existing oxide molecular-beam epitaxy instrument. The key activity in this project was the installation of a gallium oxide capability on the Sandia instrument. This required the acquisition of several custom items for the instrument, including: a gallium effusion cell, appropriate cell power supplies and temperature controllers, a shutter to block beam flux, installation of an existing ozone generator with a directed gas nozzle and controlled leak valve, and re-routing the chilled water system to accommodate the cell. In addition, beta gallium oxide single crystals were acquired and their surfaces characterized by reflection high energy electron diffraction.

Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA); USDOE Laboratory Directed Research and Development (LDRD) Program
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1563071
Report Number(s):
SAND--2016-10379R; 648323
Country of Publication:
United States
Language:
English

Similar Records

Development of a hybrid molecular beam epitaxy deposition system for in situ surface x-ray studies
Journal Article · Wed Mar 07 23:00:00 EST 2018 · Review of Scientific Instruments · OSTI ID:1425212

Accurate multiple-quantum-well growth using real-time optical flux monitoring
Journal Article · Mon Jul 04 00:00:00 EDT 1994 · Applied Physics Letters; (United States) · OSTI ID:7288843

Real-time control of molecular beam epitaxy by optical-based flux monitoring
Journal Article · Sun Dec 05 23:00:00 EST 1993 · Applied Physics Letters; (United States) · OSTI ID:5661053

Related Subjects