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Operando X-ray photoelectron spectroscopic investigations of the electrochemical double layer at Ir/KOH(aq) interfaces

Journal Article · · Journal of Electron Spectroscopy and Related Phenomena
 [1];  [2];  [3];  [4];  [3]
  1. California Institute of Technology (CalTech), Pasadena, CA (United States); DOE/OSTI
  2. California Institute of Technology (CalTech), Pasadena, CA (United States)
  3. California Institute of Technology (CalTech), Pasadena, CA (United States). Joint Center for Artificial Photosynthesis
  4. California Institute of Technology (CalTech), Pasadena, CA (United States); California Institute of Technology (CalTech), Pasadena, CA (United States). Kavli Nanoscience Institute
+ Show Author Affiliations
Tender X-ray operando photoemission spectroscopy has been used to directly analyze the energetics of the double layer at a metal-water interface in a dilute electrolyte having a Debye length of several nanometers. The data are compared to a theoretical evaluation of the potential of the solution near the electrode. Due to its noble nature, Ir was chosen as a working electrode material, and KOH(aq) at varied concentrations and thicknesses constituted the electrolyte. Shifts in peak width and binding energy of the water O 1s core level were analyzed by modeling based on Debye-Hückel approximations. The data is consistent with electrochemical formulations of the double layer that provide a foundation to electrochemistry.
Research Organization:
California Institute of Technology (CalTech), Pasadena, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
AC02-05CH11231; SC0004993
OSTI ID:
1538245
Alternate ID(s):
OSTI ID: 1550564
OSTI ID: 22889462
Journal Information:
Journal of Electron Spectroscopy and Related Phenomena, Journal Name: Journal of Electron Spectroscopy and Related Phenomena Journal Issue: C Vol. 221; ISSN 0368-2048
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English

References (19)

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Using “Tender” X-ray Ambient Pressure X-Ray Photoelectron Spectroscopy as A Direct Probe of Solid-Liquid Interface journal May 2015
Direct observation of the energetics at a semiconductor/liquid junction by operando X-ray photoelectron spectroscopy journal January 2015
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(Invited) Measurement of the Energy-Band Relations of Stabilized Si Photoanodes Using Operando Ambient Pressure X-ray Photoelectron Spectroscopy journal April 2015
An Electrochemical, Microtopographical and Ambient Pressure X-Ray Photoelectron Spectroscopic Investigation of Si/TiO 2 /Ni/Electrolyte Interfaces journal November 2015

Figures / Tables (8)

Figure 1(p. 14)figure Figure 1
Figure 2(p. 15)figure Figure 2
Figure 3(p. 16)figure Figure 3
Figure 4(p. 18)figure Figure 4
Figure 5(p. 19)figure Figure 5
Figure 6(p. 20)figure Figure 6
Figure 7(p. 21)figure Figure 7
Figure 8(p. 22)figure Figure 8

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Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
electrochemical double layer
operando XPS
solid/liquid interface