(Invited) Investigation of the Si/TiO2/Electrolyte Interface Using Operando Tender X-ray Photoelectron Spectroscopy
- California Institute of Technology (CalTech), Pasadena, CA (United States). Joint Center for Artificial Photosynthesis (JCAP)
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Technische Univ. Darmstadt (Germany)
- California Institute of Technology (CalTech), Pasadena, CA (United States)
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Chinese Academy of Sciences (CAS), Shanghai (China). Shanghai Inst. of Microsystem
Semiconductor-electrolyte interfaces provide for the creation of photoactive semiconductor systems that have band bending and other characteristics analogous to semiconductor-metal junctions (Schottky junctions). We demonstrate in our research that XPS measurements can be obtained on a full three-electrode electrochemical system under potentiostatic control by use of tender X-rays to provide photoelectrons with sufficient kinetic energy to penetrate through a thin electrolyte overlayer on a portion of the working electrode. The response of the photoelectron binding energies to variations in applied voltage demonstrates that the XPS investigation works in an operando manner to elucidate the energetics of such interfaces.
- Research Organization:
- California Institute of Technology (CalTech), Pasadena, CA (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- Grant/Contract Number:
- SC0004993; AC02-05CH11231
- OSTI ID:
- 1634113
- Journal Information:
- ECS Transactions (Online), Vol. 66, Issue 6; ISSN 1938-6737
- Publisher:
- Electrochemical SocietyCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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