Skip to main content
OSTI.GOVU.S. Department of Energy Office of Scientific and Technical Information
U.S. Department of Energy
Office of Scientific and Technical Information
 

(Invited) Investigation of the Si/TiO2/Electrolyte Interface Using Operando Tender X-ray Photoelectron Spectroscopy

Journal Article · · ECS Transactions (Online)
 [1];  [2];  [2];  [3];  [4];  [3];  [3];  [4];  [5];  [6];  [2];  [2];  [7]
  1. California Institute of Technology (CalTech), Pasadena, CA (United States). Joint Center for Artificial Photosynthesis (JCAP); California Institute of Technology, Pasadena, CA
  2. California Institute of Technology (CalTech), Pasadena, CA (United States). Joint Center for Artificial Photosynthesis (JCAP)
  3. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
  4. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  5. Technische Univ. Darmstadt (Germany)
  6. California Institute of Technology (CalTech), Pasadena, CA (United States)
  7. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Chinese Academy of Sciences (CAS), Shanghai (China). Shanghai Inst. of Microsystem
+ Show Author Affiliations
Semiconductor-electrolyte interfaces provide for the creation of photoactive semiconductor systems that have band bending and other characteristics analogous to semiconductor-metal junctions (Schottky junctions). We demonstrate in our research that XPS measurements can be obtained on a full three-electrode electrochemical system under potentiostatic control by use of tender X-rays to provide photoelectrons with sufficient kinetic energy to penetrate through a thin electrolyte overlayer on a portion of the working electrode. The response of the photoelectron binding energies to variations in applied voltage demonstrates that the XPS investigation works in an operando manner to elucidate the energetics of such interfaces.
Research Organization:
California Institute of Technology (CalTech), Pasadena, CA (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Grant/Contract Number:
AC02-05CH11231; SC0004993
OSTI ID:
1634113
Journal Information:
ECS Transactions (Online), Journal Name: ECS Transactions (Online) Journal Issue: 6 Vol. 66; ISSN 1938-6737
Publisher:
Electrochemical SocietyCopyright Statement
Country of Publication:
United States
Language:
English

Figures / Tables (4)

Figure 1(p. 3)figure Figure 1
Figure 2(p. 4)figure Figure 2
Figure 3(p. 5)figure Figure 3
Figure 4(p. 6)figure Figure 4

Similar Records

An Electrochemical, Microtopographical and Ambient Pressure X-Ray Photoelectron Spectroscopic Investigation of Si/TiO2/Ni/Electrolyte Interfaces
Journal Article · Fri Dec 04 19:00:00 EST 2015 · Journal of the Electrochemical Society · OSTI ID:1378770
Operando X-ray photoelectron spectroscopic investigations of the electrochemical double layer at Ir/KOH(aq) interfaces
Journal Article · Fri Mar 17 20:00:00 EDT 2017 · Journal of Electron Spectroscopy and Related Phenomena · OSTI ID:1538245

Related Subjects

42 ENGINEERING