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Title: Optomechanical structure for a multifunctional hard x-ray nanoprobe instrument

Patent ·
OSTI ID:1531548

A multifunctional hard x-ray nanoprobe instrument for characterization of nanoscale materials and devices includes a scanning probe mode with a full field transmission mode. The scanning probe mode provides fluorescence spectroscopy and diffraction contrast imaging. The full field transmission mode allows two-dimensional (2-D) imaging and tomography. The nanoprobe instrument includes zone plate optics for focusing and imaging. The nanoprobe instrument includes a stage group for positioning the zone plate optics. The nanoprobe instrument includes a specimen stage group for positioning the specimen. An enhanced laser Doppler displacement meter (LDDM) system provides two-dimensional differential displacement measurement in a range of nanometer resolution between the zone-plate optics and the sample holder. A digital signal processor (DSP) implements a real-time closed-loop feedback technique for providing differential vibration control between the zone-plate optics and the sample holder.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
W-31-109-ENG-38
Assignee:
UChicago Argonne, LLC (Chicago, IL)
Patent Number(s):
7,331,714
Application Number:
11/238,196
OSTI ID:
1531548
Resource Relation:
Patent File Date: 2005-09-29
Country of Publication:
United States
Language:
English

References (19)

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