Extraction and Comparison of Interface Trap Formation During BTI Stress in SiC Power MOSFETs Using Subthreshold Characteristics.
Conference
·
OSTI ID:1497796
Abstract not provided.
- Research Organization:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE Office of Electricity Delivery and Energy Reliability (OE), Power Systems Engineering Research and Development (R&D) (OE-10)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1497796
- Report Number(s):
- SAND2014-16788PE; 536654
- Country of Publication:
- United States
- Language:
- English
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