High-Voltage Silicon JFET for HV Multiplexing for the ATLAS MicroStrip Staves
Conference
·
OSTI ID:1488836
We present a new kind of silicon device: a High-Voltage vertical JFET, originally conceived as a candidate for the High-Voltage Multiplexing switch in the ATLAS upgrade of the silicon microstrip Inner Tracker (ITk). The development of the geometry as well as of the technology process flow was carried out by the help of numerical simulations, which confirmed the feasibility of such a device. Using a planar process flow, both n-type and p-type HV-JFETs have been successfully fabricated in the silicon processing facility of Brookhaven National Laboratory, starting from epitaxial wafers which have been grown according to strict specifications. Probe station measurements of un-irradiated devices show low leakage current and high breakdown voltage (up to 600V) in the OFF state, and high currents in the ON state. These JFETs, thus, satisfy most of the specs required by the HV Multiplexing switch. However, only irradiation campaigns with protons and neutrons will assess their suitability as rad-hard switches.
- Research Organization:
- Brookhaven National Laboratory (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), High Energy Physics (HEP) (SC-25)
- DOE Contract Number:
- SC0012704
- OSTI ID:
- 1488836
- Report Number(s):
- BNL-210817-2018-CPPJ
- Country of Publication:
- United States
- Language:
- English
Similar Records
A High-Voltage Silicon JFET for the HV-MUX in ATLAS ITk
A HV silicon vertical JFET: TCAD simulations
Evaluation of radiation hardness of High-Voltage silicon vertical JFETs
Conference
·
Fri Nov 09 23:00:00 EST 2018
·
OSTI ID:1489346
A HV silicon vertical JFET: TCAD simulations
Journal Article
·
Fri Dec 14 19:00:00 EST 2018
· Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
·
OSTI ID:1487243
Evaluation of radiation hardness of High-Voltage silicon vertical JFETs
Journal Article
·
Sun Nov 01 19:00:00 EST 2020
· Journal of Instrumentation
·
OSTI ID:1717899