Improvement of critical current density in thallium-based (Tl, Bi)Sr{sub 1.6}Ba{sub 0.4}Ca{sub 2}Cu{sub 3}O{sub 9-{delta}} superconductors
- State Univ. of New York at Buffalo, Amherst, NY (United States). Superconductive Materials Laboratory
- Argonne National Lab., IL (United States)
Epitaxial (Tl,Bi)Sr{sub 1.6}Ba{sub 0.4}Ca{sub 2}Cu{sub 3}O{sub x} ((Tl, Bi)-1223) thin films on (100) single crystal LaAlO{sub 3} substrates were synthesized by a two-step procedure. Phase development, microstructure, and relationships between film and substrate were studied by x-ray diffraction (XRD), scanning electron microscopy (SEM), and transmission electron microscopy (TEM). Resistance versus temperature, zero-field-cooled and field-cooled magnetization, and transport critical current density (J{sub c}) were measured. The zero-resistance temperature was 105--111 K. J{sub c} at 77 K and zero field was >2 {times} 10{sup 6} A/cm{sup 2}. The films exhibited good flux pinning properties.
- Research Organization:
- Argonne National Lab., IL (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States); New York State Energy Office, Albany, NY (United States)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 147663
- Report Number(s):
- ANL/ET/CP--82559; CONF-940627--6; ON: DE96002735
- Country of Publication:
- United States
- Language:
- English
Similar Records
Improvement of critical current density in thallium-based (Tl,Bi)Sr(1.6)Ba(0.4)Ca2Cu3O(x) superconductors
Superconductivity and microstructure of epitaxial (Tl,Bi)Sr{sub 1.6}Ba{0.4}Ca{sub 2}Cu{sub 3}O{sub 9-delta} thin films.