Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Improvement of critical current density in thallium-based (Tl,Bi)Sr(1.6)Ba(0.4)Ca2Cu3O(x) superconductors

Conference ·
OSTI ID:135392

Epitaxial (Tl,Bi)Sr(1.6)Ba(0.4)Ca2Cu3O(x) ((Tl,Bi)-1223) thin films on (100) single crystal LaAlO3 substrates were synthesized by a two-step procedure. Phase development, microstructure, and relationships between film and substrate were studied by X-ray diffraction (XRD), scanning electron microscopy (SEM), and transmission electron microscopy (TEM). Resistance versus temperature, zero-field-cooled and field cooled magnetization, and transport critical current density (J{sub c}) were measured. The zero-resistance temperature was 105-111 K. J{sub c} at 77 K and zero field was greater than 2 x 10(exp 6) A/sq cm. The films exhibited good flux pinning properties.

Research Organization:
Argonne National Lab., IL (United States)
OSTI ID:
135392
Report Number(s):
N--96-10272; NASA-CP--3290-VOL-2; S--792-VOL-2; NAS--1.55:3290-VOL-2; CONF-940627--; CNN: W-31-109-ENG-38
Country of Publication:
United States
Language:
English