Improvement of critical current density in thallium-based (Tl,Bi)Sr(1.6)Ba(0.4)Ca2Cu3O(x) superconductors
Conference
·
OSTI ID:135392
- Argonne National Lab., IL (United States)
Epitaxial (Tl,Bi)Sr(1.6)Ba(0.4)Ca2Cu3O(x) ((Tl,Bi)-1223) thin films on (100) single crystal LaAlO3 substrates were synthesized by a two-step procedure. Phase development, microstructure, and relationships between film and substrate were studied by X-ray diffraction (XRD), scanning electron microscopy (SEM), and transmission electron microscopy (TEM). Resistance versus temperature, zero-field-cooled and field cooled magnetization, and transport critical current density (J{sub c}) were measured. The zero-resistance temperature was 105-111 K. J{sub c} at 77 K and zero field was greater than 2 x 10(exp 6) A/sq cm. The films exhibited good flux pinning properties.
- Research Organization:
- Argonne National Lab., IL (United States)
- OSTI ID:
- 135392
- Report Number(s):
- N--96-10272; NASA-CP--3290-VOL-2; S--792-VOL-2; NAS--1.55:3290-VOL-2; CONF-940627--; CNN: W-31-109-ENG-38
- Country of Publication:
- United States
- Language:
- English
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Fri Jul 01 00:00:00 EDT 1994
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Sat Dec 31 23:00:00 EST 1994
· Physica C
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OSTI ID:937851