Improvement of critical current density in thallium-based (Tl,Bi)Sr{sub 1.6}Ba{sub 0.4}Ca{sub 2}Cu{sub 3}O{sub x} superconductors
Conference
·
OSTI ID:121653
- State Univ. of New York at Buffalo, Amherst, NY (United States); and others
Epitaxial (Tl,Bi)Sr{sub 1.6}Ba{sub 0.4}Ca{sub 2}Cu{sub 3}O{sub x} (Tl,Bi)-1223 thin films on (100) single crystal LaAlO{sub 3} substrates were synthesized by a two-step procedure. Phase development, microstructure, and relationships between film and substrate were studied by X-ray diffraction (XRD), scanning electron microscopy (SEM), and transmission electron microscopy (TEM). Resistance versus temperature, zero-field-cooled and field-cooled magnetization, and transport critical current density (J{sub c}) were measured. The zero-resistance temperature was 105-111 K. J{sub c} at 77 K and zero field was > 2 x 10{sup 6} A/cm{sup 2}. The films exhibited good flux pinning properties.
- Research Organization:
- National Aeronautics and Space Administration, Washington, DC (United States); National Aeronautics and Space Administration, Houston, TX (United States). Lyndon B. Johnson Space Center
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 121653
- Report Number(s):
- CONF-940627--Vol.2; ON: TI95017155
- Country of Publication:
- United States
- Language:
- English
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Superconductivity and microstructure of epitaxial (Tl,Bi)Sr{sub 1.6}Ba{0.4}Ca{sub 2}Cu{sub 3}O{sub 9-delta} thin films.
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Fri Jul 01 00:00:00 EDT 1994
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OSTI ID:147663
Improvement of critical current density in thallium-based (Tl,Bi)Sr(1.6)Ba(0.4)Ca2Cu3O(x) superconductors
Conference
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Fri Mar 31 23:00:00 EST 1995
·
OSTI ID:135392
Superconductivity and microstructure of epitaxial (Tl,Bi)Sr{sub 1.6}Ba{0.4}Ca{sub 2}Cu{sub 3}O{sub 9-delta} thin films.
Journal Article
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Sat Dec 31 23:00:00 EST 1994
· Physica C
·
OSTI ID:937851