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Office of Scientific and Technical Information

Summary of Total Dose Testing on IBM Bottom Oxidation Through STI (BOTS) FinFETs [Slides]

Technical Report ·
DOI:https://doi.org/10.2172/1467777· OSTI ID:1467777
State of the art semiconductor processes have created high performance and low power consumption technologies. There is a drive to use these technologies for commercial space, defense, and infrastructure.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000; NA0003525
OSTI ID:
1467777
Report Number(s):
SAND--2018-9355R; 667354
Country of Publication:
United States
Language:
English

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