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Nitrogen implantation effects on the chemical bonding and hardness of boron and boron nitride coatings

Conference ·
OSTI ID:14547

Boron nitride (BN) coatings are deposited by the reactive sputtering of fully dense, boron (B) targets utilizing an argon-nitrogen (Ar-N{sub 2}) reactive gas mixture. Near-edge x-ray absorption fine structure analysis reveals features of chemical bonding in the B 1s photoabsorption spectrum. Hardness is measured at the film surface using nanoindentation. The BN coatings prepared at low, sputter gas pressure with substrate heating are found to have bonding characteristic of a defected hexagonal phase. The coatings are subjected to post-deposition nitrogen (N{sup +} and N{sub 2}{sup +}) implantation at different energies and current densities. The changes in film hardness attributed to the implantation can be correlated to changes observed in the B 1s NEXAFS spectra.

Research Organization:
Lawrence Livermore National Lab., CA (US)
Sponsoring Organization:
USDOE Office of Defense Programs (DP) (US)
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
14547
Report Number(s):
UCRL-JC-133133; YN0100000; YN0100000
Country of Publication:
United States
Language:
English

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